Siliconsystems, Inc.

David E Merry, Jr

Michael J Hajeck

Mark Diggs

Gary A Drossel

A storage system that comprises multiple solid-state storage devices includes a command set that enables a host system to initiate one or more types of purge operations. The supported purge operations may include an erase operation in which the storage devices are erased, a sanitization operation in which a pattern is written to the storage devices, and/or a destroy operation in which the storage devices are physically damaged via application of a high voltage. The command set preferably enables the host system to specify how many of the storage devices are to be purged at a time during a purge operation. The host system can thereby control the amount of time, and the current level, needed to complete the purge operation. In some embodiments, the number of storage devices that are purged at a time may additionally or alternatively be selectable by a controller of the storage system.

Purge operations for solid-state storage devices

A memory system comprising one or more memory devices is purged to prevent unauthorized access to data stored therein. A host system passes control of purge operations to the memory system. The purge operations are configured to erase data, write a pattern to memory locations, physically damage the memory devices in the memory system, or combinations of the foregoing. The memory system can perform a purge operation on two or more memory devices in parallel. The memory system includes a destroy circuit to provide an over-current and/or over-voltage condition to the memory devices. The memory system also includes one or more isolation circuits to protect control circuitry in the memory system from the over-current and/or over-voltage condition. In some embodiments, the memory system includes a backup battery so it can complete a purge operation if it loses its power connection to the host system.

Systems and methods for reducing unauthorized data recovery from solid-state storage devices

A non-volatile solid-state storage subsystem, such as a non-volatile memory device, maintains usage statistics reflective of the wear state, and thus the remaining useful life, of the subsystem's memory array. A host system reads the usage statistics information, or data derived therefrom, from the subsystem to evaluate the subsystem's remaining life expectancy. The host system may use this information for various purposes, such as to (a) display or report information regarding the remaining life of the subsystem; (b) adjust the frequency with which data is written to the subsystem; and/or (c) select the type(s) of data written to the subsystem.

Systems and methods for measuring the useful life of solid-state storage devices

A memory system comprising one or more memory devices is purged to prevent unauthorized access to data stored therein. A host system passes control of purge operations to the memory system. The purge operations are configured to erase data, write a pattern to memory locations, physically damage the memory devices in the memory system, or combinations of the foregoing. The memory system can perform a purge operation on two or more memory devices in parallel. The memory system includes a destroy circuit to provide an over-current and/or over-voltage condition to the memory devices. The memory system also includes one or more isolation circuits to protect control circuitry in the memory system from the over-current and/or over-voltage condition. In some embodiments, the memory system includes a backup battery so it can complete a purge operation if it looses its power connection to the host system.

Growing community of inventors

Bondsville, MA, United States of America

David E Merry, Jr