Philips Electronic and Associated Industries Ltd.

David E Charlton

Charles Thomas Elliott

Between the spaced biasing electrodes of a thermal radiation imaging device A D.C. bias source is connected to cause the flow of a bias current in the device body which is preferably of n-type cadmium mercury telluride. The bias current supports an ambipolar drift of radiation-generated minority carriers (holes) in the opposite direction. The device is operated in a system in which the radiation pattern is scanned across the device body in the same direction and at the same rate as the ambipolar velocity. Instead of having a single read-out electrode, a more sophisticated system with better performance is obtained by distributing between the spaced biasing electrodes a plurality of read-out electrodes each of which forms a Schottky barrier or p-n junction with the body material.

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Southampton, United Kingdom

David E Charlton