General Electric Company

David Charles Franklin

Thomas James Batzinger

Bruno Hans Haider

Robert S Gilmore

William Thomas Hatfield

Edward James Nieters

James Norman Barshinger

Richard Eugene Klaassen

Wei Li

Carl Lawrence Chalek

Robert John McElligott

Robert Snee Gilmore

Eugene Klaassen Richard

Robert John Mceilligott

A method for inspecting a component includes exciting a number of transducers forming an array to produce an ultrasonic transmission beam (beam) focused into the component. The array and the component are separated by a standoff. A number of echo signals are generated using the transducers, and the echo signals are processed in a number of channels. The processing includes both dynamical focus and providing a dynamic aperture on receive, both of which compensate for refraction of the beam at the component/standoff interface. A single-turn inspection method includes: (a) positioning the array facing the component, (b) exciting the transducers, (c) generating a number of echo signals, (d) changing the relative angular orientation of the array and the component around an axis and repeating steps (b) and (c), and (e) processing the echo signals to form at least one processed echo signal.

Phased array ultrasonic inspection method for industrial applications

Growing community of inventors

Cincinnati, OH, United States of America

David Charles Franklin