Sun Microsystems, Inc.

David C Gurchinoff

Terrence Barr

Eran Davidov

Jamie D Riggs

Michael J Parks

A test apparatus including a data interface configured to couple with at least one of a test device and a baseline device, and a computing device configured to perform a method including performing a first benchmark on a baseline device for a predetermined time interval, resulting in a first dataset representing work performed by the baseline devices, performing a second benchmark on a test device for the predetermined time interval resulting in a second dataset representing work performed by the test device, and using a heuristic including a number of tests to determine whether the test device has an acceptable level of performance relative to the baseline device.

Apparatus for comparing performance of electronic devices

A method for evaluating portable electronic devices includes performing a first benchmark on a baseline device for a predetermined time interval, resulting in a first dataset representing work performed by the baseline device. The method further includes performing a second benchmark on a test device for the predetermined time interval resulting in a second dataset representing work performed by the test device. Finally, the test device is determined to be initially acceptable if the total amount of work performed by the test device and the total amount of work performed by the baseline device differ by less than an acceptance threshold, and is determined to be finally acceptable by performing a quotient test on the data.

Growing community of inventors

San Jose, CA, United States of America

David C Gurchinoff