Growing community of inventors

Bethlehem, PA, United States of America

David Barry Rennie

Average Co-Inventor Count = 4.50

ph-index = 2

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 43

David Barry RennieMadhukar Bhaskara Rao (3 patents)David Barry RennieGene Everad Parris (3 patents)David Barry RennieDnyanesh Chandrakant Tamboli (3 patents)David Barry RennieRajkumar Ramamurthi (3 patents)David Barry RennieGautam Banerjee (2 patents)David Barry RennieRoberto John Rovito (2 patents)David Barry RennieDana L Durham (2 patents)David Barry RennieYi-Chia Lee (1 patent)David Barry RennieAiping Wu (1 patent)David Barry RennieRajiv Krishan Agarwal (1 patent)David Barry RennieTerence Collier (1 patent)David Barry RennieMark Richard Brown (1 patent)David Barry RennieCharles A Lhota (1 patent)David Barry RennieYi-Chia Lee (0 patent)David Barry RennieDavid Barry Rennie (6 patents)Madhukar Bhaskara RaoMadhukar Bhaskara Rao (39 patents)Gene Everad ParrisGene Everad Parris (18 patents)Dnyanesh Chandrakant TamboliDnyanesh Chandrakant Tamboli (16 patents)Rajkumar RamamurthiRajkumar Ramamurthi (3 patents)Gautam BanerjeeGautam Banerjee (9 patents)Roberto John RovitoRoberto John Rovito (9 patents)Dana L DurhamDana L Durham (4 patents)Yi-Chia LeeYi-Chia Lee (29 patents)Aiping WuAiping Wu (20 patents)Rajiv Krishan AgarwalRajiv Krishan Agarwal (8 patents)Terence CollierTerence Collier (5 patents)Mark Richard BrownMark Richard Brown (2 patents)Charles A LhotaCharles A Lhota (1 patent)Yi-Chia LeeYi-Chia Lee (0 patent)
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Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. Air Products and Chemicals, Inc. (5 from 3,191 patents)

2. Versum Materials Us, LLC (1 from 200 patents)


6 patents:

1. 10073351 - Semi-aqueous photoresist or semiconductor manufacturing residue stripping and cleaning composition with improved silicon passivation

2. 9328318 - Method for wafer dicing and composition useful thereof

3. 8883701 - Method for wafer dicing and composition useful thereof

4. 8580656 - Process for inhibiting corrosion and removing contaminant from a surface during wafer dicing and composition useful therefor

5. 6821352 - Compositions for removing etching residue and use thereof

6. 6677286 - Compositions for removing etching residue and use thereof

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as of
1/5/2026
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