Spectramet, LLC

Other

Massachusetts Institute of Technology

Melt Cognition, LLC

Sprectramet, LLC

David B Spencer

Edward J Sommer, Jr

Charles E Roos

Robert H Parrish

R Lynn Conley

Mark Edgson

Richard E Hill

Merton C Flemings

Robert Mehrabian

Laurie Anne Spencer

Diran Apelian

Robert De Saro

Jeffrey J Webster

Aldo M Reti

Michael Scott Mellen

Insert strip for shingled roofs

Insert for roof shingle or tile

Organizer

According to some aspects, a system for producing a target molten metal composition is provided. The system includes a sorting device that sorts input pieces of metal based on a control signal. Sorted pieces of metal are melted in a furnace, and a sensor measures the composition of molten metal in the furnace and in response generates a control signal that is sent to the sorting device.

Metal sorting, melting and fabrication apparatus and methods

A shingle insert and method for eliminating and preventing growths on a shingled roof in which copper strips forming the inserts are installed with an upper edge disposed beneath a course of shingles with the remaining portions of the insert exposed. The insert strips have a confined space defined beneath a stiffening lengthwise extending arched hump formed in the exposed copper strip portions which has an array of elongated indentations formed therein with slits therein to allow slow drainage of water impounded by the arched hump through the inserts may contain a growth toxic material, in solid or granular form which releases a substance toxic to the growths when rainwater runoff passes into the confined space and over the material and thereafter flows out down the roof.

Shingle inserts and method for eliminating and preventing growth of algae, moss, or lichens on a roof

Disclosed herein is a metal sorting device including an X-ray tube, a dual energy detector array, a microprocessor, and an air ejector array. The device senses the presence of samples in the x-ray sensing region and initiates identifying and sorting the samples. After identifying and classifying the category of a sample, at a specific time, the device activates an array of air ejectors located at specific positions in order to place the sample in the proper collection bin.

Method and apparatus for sorting materials according to relative composition

Systems for sorting materials, such as those made of metal, are described. The systems may operate by irradiating the materials with x-rays and then detecting fluoresced x-rays, transmitted x-rays, or both. Detection of the fluoresced x-rays may be performed using an x-ray fluorescence detector array. The systems may be configured to provide high throughput sorting of small pieces of materials.

Material sorting technology

A system and process for classifying a piece of material of unknown composition at high speeds, where the system connected to a power supply. The piece is irradiated with first x-rays from an x-ray source, causing the piece to fluoresce x-rays. The fluoresced x-rays are detected with an x-ray detector, and the piece of material is classified from the detected fluoresced x-rays. Detecting and classifying may be cumulatively performed in less than one second. An x-ray fluorescence spectrum of the piece of material may be determined from the detected fluoresced x-rays, and the detection of the fluoresced x-rays may be conditioned such that accurate determination of the x-ray fluorescence spectrum is not significantly compromised, slowed or complicated by extraneous x-rays. The piece of material may be classified by recognizing the spectral pattern of the determined x-ray fluorescence spectrum. The piece of material may be flattened prior to irradiation and detection. The x-ray source may irradiate the first x-rays at a high intensity, and the x-ray source may be an x-ray tube.

High speed materials sorting using X-ray fluorescence

A piece of material that includes low-Z elements is classified based on photonic emissions detected from the piece of material. Both XRF spectroscopy and OES techniques, for example, Laser-Induced Breakdown Spectroscopy (LIBS) and spark discharge spectroscopy, may be used to classify the piece of material. A stream of pieces of material are moved along a conveying system into a stimulation and detection area. Each piece of material, in turn, is stimulated with a first and second stimulus, of a same or different type, causing the piece of material to emit emissions, for example, photons, which may include at least one of x-ray photons (i.e., x-rays) and optical emissions. These emissions then are detected by one or to more detectors of a same or different type. The piece of materials is then classified, for example, using a combination of hardware, software and/or firmware, based on the detected emissions, and then sorted.

Sorting pieces of material based on photonic emissions resulting from multiple sources of stimuli

A method for inhibiting growths on shingled roofs, one or more of the strips installed along shingle courses. The strips are preferably formed of copper and have an upper portion formed with a pattern of through holes along the length of the strip and pattern of dimples extending along a lower portion of the length of the strips to increase the duration and extent of contact of rain or dew with the copper metal to increase the release of cupric ions effective in inhibiting growths on the roof.

Method and roofing strip for retarding moss, fungi, and algae growth on roofs

A piece of material that includes low-Z elements is classified based on photonic emissions detected from the piece of material. Both XRF spectroscopy and OES techniques, for example, Laser-Induced Breakdown Spectroscopy (LIBS) and spark discharge spectroscopy, may be used to classify the piece of material. A stream of pieces of material are moved along a conveying system into a stimulation and detection area. Each piece of material, in turn, is stimulated with a first and second stimulus, of a same or different type, causing the piece of material to emit emissions, for example, photons, which may include at least one of x-ray photons (i.e., x-rays) and optical emissions. These emissions then are detected by one or more detectors of a same or different type. The piece of materials is then classified, for example, using a combination of hardware, software and/or firmware, based on the detected emissions, and then sorted.

Growing community of inventors

Bedford, MA, United States of America

David B Spencer