Advanced Micro Devices Corporation

Other

David Alan Richardson

Donald Craig Likes

Russell Clinton Brown

Yurong Shi

Larry D Barto

Robert Michael Russin

Jeffrey B Toth

Yiwei Li

Richard Bruce Patty

Barry R Hobbs

Nils Bertelsen

William A Norris

A method includes transforming, based on a first transform, a first markup language document associated with a first version of a schema to generate a second markup language document associated with a second version of the schema. The second markup language document is representative of a third markup language document associated with the second version of the schema and the first transform represents a transform from the first version of the schema to the second version of the schema. The method further includes comparing the second markup language document to the third markup language document to identify whether at least one discrepancy exists between the second markup language document and the third markup language document. The method additionally includes determining a suitability of the first transform based on the comparison of the second markup language document to the third markup language document.

Method and system for schema version transform verification

A method and system for generating security rules for implementation by a rule interpretation engine to define accessibility to one or more aspects of an Enterprise System is described. The method and system allow a security officer to graphically indicate an operation to be affected by the security rule being defined; a specific aspect of the system affected by the rule; a security regulation to be implemented by the rule; and an access type to be permitted by the rule.

Method and system for generating access policies

A process, architecture, and computer program product for using the inheritance features of an object-oriented system to enable multiple programmers to modify different behaviors of an object concurrently. A first method and a second method to be performed on the object are identified. The first method is developed in a first application having a first subclass of the object's class. A first application-specific object is an instantiation of the first subclass. The second method is concurrently developed in a second application having a second subclass of the object's class. A second application-specific object is an instantiation of the second subclass. Invoking the first method performs the first method on the first application-specific object, such that the object communicates as if the first method were performed on the object. Modifying the first method does not affect the second method, and vice versa.

Use of inheritance to allow concurrent programming

An architecture for integrating data between a plurality of software applications in a factory environment comprises a factory system and a domain application. The factory system comprises a domain object superclass and at least two first-level subclasses of the domain object superclass. An instantiation of one of the first-level subclasses corresponds to a domain object, which represents an item in a factory. The factory system also includes a service, which provides an operation related to the domain object. The service comprises at least one component, where each component is operable to perform the operation related to the domain object. The architecture also includes a domain application, which implements a component of the service of the factory system to perform the operation related to the domain object. The architecture can optionally include a system manager for managing hardware and software in the factory.

System for integrating data between a plurality of software applications in a factory environment

In its various embodiments, the method collects data from process and metrology tools in a semiconductor manufacturing environment, generates statistics from that data, detects tool failures, processing errors, and other conditions that can jeopardize product output, and performs high level process control in the form of tool shutdowns, lot holds, and lot releases. One method as disclosed automates the collection and recording of data from process and metrology tools, automates configuration of data collection, and automates process equipment shut downs, all within the existing framework of existing MES systems and engineering data collection systems. Automation of configurations and data collection is conducted by creation of data collection plans, data collection capability specifications, and other versioned documents within a process control and data collection system as disclosed herein. These versioned documents may be generated through a common graphical user interface and presented via an Internet web browser or other network interface.

System and software for data collection and process control in semiconductor manufacturing and method thereof

A sprouter having a wall or walls defining the lateral extent of a growing chamber, and a base connected to the wall or walls for forming a bottom of the chamber. The base includes proturbances that form indentations on the base for retaining a quantity of water which supplies sprouts growing in the growing chamber with water for a predetermined length of time. The proturbances also prevent seeds in the growing chamber from sliding when the base is tilted slightly during movement.

Growing community of inventors

Austin, TX, United States of America

David Alan Richardson