Cypress Semiconductor Corporation

Silicon Light Machines Corporation

David A LeHoty

Antonio Visconti

Bryan P Staker

Clinton Carlisle

Jahja I Trisnadi

David T Amm

Charles B Roxlo

Douglas Webb

Paul A Alioshin

Mark A Koenig

A design system is provided. In one embodiment the design system includes an input module to receive specification data for a designed circuit including a configurable integrated circuit (IC). The configurable IC includes a number of analog elements for which parameters can be set by the design system, and a plurality of configurable signal path elements including an analog-to-digital converter (ADC) that is utilized in a plurality of different signal paths. The design system further includes a design module to generate a design for the designed circuit based on the specification data, and an output module to set parameters of at least one of the analog elements based on the design. Other embodiments are also provided.

Integrated circuit including parametric analog elements

A parameterizable integrated circuit (IC) and method for designing, refining and implementing a circuit including the parameterizable IC are described. The method begins with receiving information on candidate sensing sub-circuits, parameterizable ICs and user specified requirements for the circuit including physical properties to be sensed and target values for the circuit. Each of the parameterizable ICs include a number of parametric analog and digital circuit elements, and a scheduler to schedule resources of the IC according to measurement priorities, measurement rates and the available circuit elements. Next, each of the candidate sensor-sub-circuits is evaluated with reference to the specified requirements, and each of the candidate ICs evaluated with reference to the requirements and the sensor-sub-circuits. Generally, the method further includes communicating to a user a number of candidate circuit-designs within a predetermined percentage of the one or more target values for the circuit.

A method is provided for designing and implementing a circuit comprising an integrated circuit (IC) including a number of analog and digital circuit elements for which operating parameters can be set. In one embodiment the method includes entering in a circuit design tool embodied in a computer readable medium on a server specified requirements for a circuit, the specified requirements including physical properties to be sensed by the circuit. The circuit is automatically modeled by the circuit design tool based on the specified requirements and resources available on the IC, the modeling including translating the specified requirements into parameter settings of the number of the analog and digital circuit elements. The circuit is then built, the building including setting parameters of at least one of the analog and digital circuit elements of the IC using the circuit design tool based on the modeling of the circuit.

Tool and method for refining a circuit including parametric analog elements

An environment and method are provided for designing and implementing a circuit comprising an integrated circuit (IC) including a number of parametric analog elements for which operating parameters can be set. Generally, the method comprises: specifying requirements for the circuit including physical properties to be sensed by the circuit and actions to be taken by the circuit; designing the circuit based on the specified requirements and resources available on the IC; and setting parameters of at least one of the parametric analog circuit elements of the IC based on the circuit design. In one embodiment, the specifying, designing, and setting parameters steps are performed using a computer executable code embodied in a computer readable medium on a server coupled to a client computer through an internet protocol network. Other embodiments are also provided.

Implementing a circuit using an integrated circuit including parametric analog elements

One embodiment described relates to an optical displacement sensor for sensing movement of a data input device across a surface by detecting displacement of optical features in a succession of images of the surface. The sensor includes a detector having an array including a number (N) of sets of photosensitive elements, each set having a number (M) of photosensitive elements, where M is greater than two and not equal to four. Signals from each of the photosensitive elements in a set are electrically coupled or combined with corresponding photosensitive elements in other sets to produce a total of M independent group signals from M interlaced groups of photosensitive elements. Other embodiments are also described.

Optical position sensing device including interlaced groups of photosensitive elements

One embodiment disclosed relates to a method for bi-directional progressive scanning in a display system. The method includes receiving image data for an image to be displayed, forward scanning the image data in a first direction using a linear array of controllable light elements, and reverse scanning the image data in a second direction opposite to the first direction using the linear array. Another embodiment disclosed relates to an apparatus for bi-directional progressive scanning. The apparatus includes a linear array of controllable light elements, and a scanner driver that drives a scanner apparatus using a drive signal that is applied to drive both forward and reverse optical scanning of an image by the linear array.

Triangular bidirectional scan method for projection display

One embodiment disclosed relates to a method for calibrating an array of light-modulating elements. The method includes illuminating the array of elements, modulating an intensity of light diffracted by the elements over a modulation range, and measuring the modulated light intensity from each element of the array using a linear detector. Other embodiments disclosed relate to an apparatus and system for calibrating an array of light-modulating elements. The apparatus includes a light source for illuminating the array of elements and a linear detector for measuring light intensities at points along a line segment. The apparatus is configured so that modulated light from each of the elements impinges upon a different point of the line segment. The system includes means for modulating an intensity of light diffracted by the elements over a modulation range and a detector for measuring the modulated light intensity from each element of the array.

Method and apparatus for calibration of light-modulating array

One embodiment disclosed comprises a method for bipolar operation of a light-modulating array. The method includes driving light-modulating elements of the array in a first polarity, switching polarities from the first polarity to a second polarity, driving the light-modulating elements of the array in a second polarity, switching polarities from the second polarity to the first polarity, and repeating the steps. Another embodiment disclosed comprises an apparatus utilizing a light-modulating array. The apparatus includes a first look-up table storing data for operating elements the light-modulating array in a first polarity mode, and a second look-up table storing data for operating the elements of the light-modulating array in a second polarity mode. The apparatus also includes a drive system for driving the elements of the light-modulating array. The drive system is coupled to both the first and second look-up tables.

Bipolar operation of light-modulating array

One embodiment disclosed relates to a system for modulating a plurality of micro-electromechanical (MEM) devices. The system includes a means for providing an amplitude modulation signal to each MEM device at a base frequency and a means for providing a width modulation signal at the base frequency. In addition, the system includes a clock means for providing a higher-frequency clock signal with a frequency that is a multiple of the base frequency. In this embodiment, the width modulation signal for each MEM device indicates at least one position on the higher-frequency clock signal.

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Mountain View, CA, United States of America

David A LeHoty