Electro Scientific Industries, Inc.

David A Bruno

Quang Nguyen

John T Gross

David M Brooks

Mark J Brooks

John R Jungblut

Methods and apparatus for vibration-generated movement and manipulation, such as transportation, orientation, loading or sorting of materials are provided. At least one electromagnetic coil is disposed to act in a horizontal plane, and another electromagnetic coil may be disposed to act in a vertical plane, imparting two-dimensional vibration to a generally horizontal vibratory surface. Apparatus vibrationally transports parts across a surface while concurrently orienting and sorting them. Reversibility of transport direction is also provided.

Vibratory movement and manipulation apparatus and method

A system (100) performs concurrent testing and lead verification of an electronic component (104) having two leads (126 and 128). The system includes circuitry (114 and 116) for determining a sum of amounts of contact resistances between first (132) and second (134) probes and one of the leads by producing a current (I.sub.1) that propagates through the first probe, the lead of the component, and the second probe. The sum of the contact resistances is proportional to the difference in voltage between the leads. If the difference exceeds a limit, then the sum of the amount of contact resistances is excessive. The system also includes circuitry (110) for determining a value of a parameter of the component while the sum of the amounts of contact resistances is being determined. The circuit for determining the sum of the contract resistances and the circuitry for determining the value of the parameter are electrically isolated from each other so that they do not influence each other.

Method and system for concurrent electronic component testing and lead

The apparatus (20) includes electrically conductive contacts (44, 54) that are spaced apart a distance slightly less than the distance between the terminals (34, 36) formed on the components (24) to be tested. One contact (54) is held in position by a spring (112). The other contact (44) is stationary. The contacts (44, 54) slide against the terminal surfaces (52, 56) of the components (24) that are conveyed into a test location (26) between the contacts. The apparatus employs few moving parts and the sliding motion of the contacts (44, 54) against the terminal surfaces (52, 56) ensures that the contacts (44, 54) penetrate any oxide layer present on the terminal surfaces (52, 56). In an alternative embodiment (160), two sets of contacts (44L, 44T, 54L, 54T) are employed for testing components (24) in two adjacent test locations (26L, 26T). One configuration of a movable contact (304) is such that minimal force is applied to the terminal surfaces (52, 56) of the components (24) so that the components may be tested without marking or damaging the surfaces (52, 56).

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San Diego, CA, United States of America

David A Bruno