Photon Dynamics, Inc.

Dave Smiley

Yan Wang

Kaushal Gangakhedkar

David L Baldwin

Nile Alexander Light

Kent Nguyen

Thomas H Bailey

Alan Cable

Steve Aochi

Atila Ersahin

Kiran Jitendra

Hai Tran

Thomas E Wishard

A probe system for facilitating the inspection of a device under test. System incorporates a storage rack; a probe bar gantry assembly; a probe assembly configured to electrically mate the device under test; and a robot system for picking the probe assembly from the storage rack and deliver the probe assembly to the probe bar gantry. The robot system is also enabled to pick a probe assembly from the probe bar gantry and deliver the probe assembly to the storage rack. The probe assembly includes a clamping assembly for attaching the probe assembly to the probe bar gantry or the storage rack. The probe assembly may include an array of contact pins configured to mate with conductive pads on the device under test when the probe assembly is installed on the probe bar gantry assembly.

Automatic probe configuration station and method therefor

Growing community of inventors

San Jose, CA, United States of America

Dave Smiley