Sandisk 3d LLC

Infineon Technologies Ag

Infineon Technologies North America Corp.

Dat Nguyen

Tanmay Kumar

Xiying Chen

Deepak Chandra Sekar

Er-Xuan Ping

George Samachisa

Mark Harold Clark

Bing K Yen

Huiwen Xu

James Wilson Rae

Michael Carson

An integrated circuit including vertically oriented diode structures between conductors and methods of fabricating the same are provided. The diode is a metal-insulator diode having a first metal layer, a first insulating layer, a second insulating layer and a second metal layer. At least one asymmetric interface state is provided at the intersection of at least two of the layers to increase the ratio of the diode's on-current to its reverse bias leakage current. In various examples, the asymmetric interface state is formed by a positive or negative sheet charge that alters the barrier height and/or electric field at one or more portions of the diode. Two-terminal devices such as passive element memory cells can utilize the diode as a steering element in series with a state change element. The devices can be formed using pillar structures at the intersections of upper and lower conductors.

Dual insulating layer diode with asymmetric interface state and method of fabrication

A nonvolatile memory cell includes a steering element located in series with a storage element. The storage element includes a carbon material and the memory cell includes a rewritable cell having multiple memory levels.

Multilevel nonvolatile memory device containing a carbon storage material and methods of making and using same

Systems and methods for accumulating data relating to the performance of one or more components of a read channel are described. In one aspect, a programmable channel quality monitor is operable to accumulate performance data corresponding to a recorded test data sequence spanning two or more data sectors of the magnetic medium. The channel quality monitor preferably is incorporated in a disk drive system. A method of accumulating performance data from a read channel also is described. In accordance with this inventive method, an original test data pattern is written to multiple data sectors of the magnetic medium. The original test pattern is read from the multiple data sectors of the magnetic medium to produce a readback test pattern. In this method, performance data relating to a comparison of the original test pattern and the readback test pattern is accumulated.

Accumulating read channel performance data

The present invention provides a method and/or circuit for achieving a near 50 percent duty cycle divide-by-odd-integer output of an input reference clock.

Apparatus and method for odd integer signal division

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San Jose, CA, United States of America

Dat Nguyen