Other

Simtek Corporation

Cypress Semiconductor Corporation

Daryl G Dietrich

Gary F Derbenwick

Christian E Herdt

Paul Fredrick Ruths

John Roger Gill

Jaskarn Singh Johal

The present invention includes apparatus and a method for reading one or more data states from an integrated circuitry memory cell, including the steps of connecting the memory cell to a bit line which is connected to an amplifier having an offset control which introduces an offset during the sensing portion of a read cycle to identify a data state stored in the memory cell.

Integrated multilevel memory apparatus and method of operating same

An integrated circuit memory contains a memory cell connected to a bit line that does not float during a portion or all of the read sensing part of the read cycle. The memory cell includes a data storage device. The data storage device may be a ferroelectric capacitor, a linear capacitor, a floating gate transistor, a magnetic device, a resistive device or other type of data storage device capable of placing a charge on the bit line corresponding to a specific data state of the memory cell. The bit line and a reference bit line are connected to a differential amplifier and precharged to specified voltages. Preferably, a self-nulling sense amplifier circuit is connected to the bit lines that compensates for sense amplifier offset by applying additional charges on the bit lines. Alternatively, charge sources may be connected to the bit lines to provide additional charges on the bit lines during the read cycle. Memory cells according to this invention can be configured to provide a reference cell for the reference bit line.

Integrated memory device and method of operating same

A system and method for determining a SONOS Vwindow using a current sensing scheme is disclosed. The present invention creates a first current path and a second current path through the volatile and non-volatile sections of an nvSRAM memory cell. The erase threshold voltage of the first edge of the window is determined when current is detected in the first path. The program voltage of the second edge of the window is determined when current is detected in the second path. Accordingly, the voltage used to power a plurality of SONOS transistors may be set using the values of the first and second threshold edges to determine the Vwindow.

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The invention relates to a non-volatile, static random access memory (nvSRAM) device that is capable of high speed copying of the data in the static random access portion of the device into the non-volatile portion of the device after the detection of possible loss of power. This is accomplished by preparing the non-volatile portion for receiving a bit of data from the SRAM portion before the possible loss of power is detected, i.e., pre-arming the device. In one embodiment, the pre-arming is accomplished by erasing the non-volatile portion during the time when the power supply is stable and data can be transferred between the SRAM portion and the exterior environment. In another embodiment, pre-arming is accomplished by erasing the non-volatile portion immediately after power has been provided to the device and data from the non-volatile portion has been copied into the SRAM in a recall operation. Another aspect of the invention provides for the decoupling of the erase and store operations. This facilitate, for example, the erase of the data in the non-volatile portion of the nvSRAM without a subsequent copying of data in the SRAM portion into the non-volatile portion.

Non-volatile, static random access memory with high speed store

The invention relates to a non-volatile, static random access memory (nvSRAM) device that addresses the consequence of a manufacturing defect that occasionally occurs during mass production of the nvSRAM device and if not addressed, reduces the yield of the production process. The consequence of the defect is termed a store disturb because the execution of a store operation in a defective nvSRAM causes the bit of data retained in the SRAM portion and, in some cases, the nv portion of the nvSRAM to be instable or corrupted. The present invention provides an nvSRAM device in which the controller provides modified signals to the nvSRAM memory portion of the device that address the store disturb phenomena and, as a consequence, improve the yield of the manufacturing process.

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Woodland Park, CO, United States of America

Daryl G Dietrich