Applied Optoelectronics, Inc.

Darren Tucker

Justin Lii

Luohan Peng

David Hendricks

A test fixture generally includes a thermoelectric cooler (TEC) configured to regulate the temperature of a device under test (DUT). The test fixture may further include a device carrier configured to secure the DUT in a desired position relative to the TEC and a spring-operated pin configured to generate a desired contact pressure between the DUT and the TEC. The desired contact pressure may be selected to achieve a thermal coupling between the DUT and the TEC that maintains the temperature of the DUT at a desired operation level.

Test fixture with thermoelectric cooler and spring-operated holding pin

An adapter for coupling an air duct having an air duct mating end to a fan-driven vent unit having an air intake opening. The air duct may be a circular cross sectional air duct, for example, and the vent unit may comprise a HEPA or other filter. The adapter has a first mating section compatible with the air duct mating end (e.g., circular) for coupling the adapter to the air duct mating end, and a second mating section for coupling the adapter to the air intake opening of the fan-driven vent unit. Side walls of the adapter, between or part of the first and second mating sections, have supply-relief holes for providing a supply of air to the air intake opening when the air duct provides no air supply (e.g., when it is closed off by a damper system).

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Houston, TX, United States of America

Darren Tucker