Hyundai Electronics America, Inc.

At&t Global Information Solutions Company

Symbios Logic Inc.

Darrell L Pruehsner

Kevin J Gearhardt

A scan-based logic test apparatus is provided for use with an automated test equipment (ATE) digital tester which tests scan-based logic IC devices. The test apparatus is embodied in a test card which is pluggable into a bus slot within a computer. The computer includes a permanent memory for storing scan-based pattern data including serial input pattern data and expected serial output pattern data. The test card includes an I/O interface control which interfaces the test card to the computer to permit retrieval of the scan-based pattern data from the permanent memory and which interfaces the test card to the digital tester to permit the tester to supply control signals to the test card. The test card further includes an SRAM memory which is coupled to the I/O interface control. The SRAM memory stores the scan-based pattern data including serial input pattern data and expected serial output pattern data upon retrieval thereof from the permanent memory by the I/O interface control. The test card also includes an IC device interface for coupling the IC device to the SRAM memory and the I/O interface control, such that the serial input pattern data is provided to the IC device and an responsive serial output pattern data is collected from the IC device. The responsive serial output pattern data is compared with the expected serial output pattern data to make a pass/fail decision with respect to the particular IC device under test.

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Bellvue, CO, United States of America

Darrell L Pruehsner