Globalfoundries Singapore Pte. Ltd.

Infineon Technologies Ag

International Business Machines Corporation

Agency for Science, Technology and Research

Globalfounders Singapore Pte. Ltd.

Globalfoudnries Singapore Pte. Ltd.

Danny Pak-Chum Shum

Juan Boon Tan

Wanbing Yi

Jiang Yan

Yi Jiang

Shyue Seng Tan

Eng Huat Toh

Pinghui Li

Ming Zhu

Armin Tilke

Xinshu Cai

Fan Zhang

Hai Cong

Bharat Bhushan

John Power

Darin A Chan

Curtis Chun-I Hsieh

Soh Yun Siah

Bum Ki Moon

Moosung Chae

Ronald Kakoschke

Yiang Aun Nga

Alex See

Chun-Yung Sung

Alois Gutmann

Robert Strenz

Wolfram Langheinrich

Shan Gao

Martin Stiftinger

Daxiang Wang

Francis YongWee Poh

Fook Hong Lee

Boo Yang Jung

Laiqiang Luo

Hyunwoo Yang

Laura Pescini

Young Seon You

Bhushan Bharat

Haiqing Zhou

Liying Zhang

Karl Robert Strenz

Francis Yong Wee Poh

Su Yi Susan Yeow

Kangho Lee

Christian Geissler

Elgin Kiok Boone Quek

Guowei Zhang

Haoren Zhuang

Desmond Jia Jun Loy

Yuan Sun

Franz Schuler

Sun-Oo Kim

Tze Ho Simon Chan

Benfu Lin

Mahesh Bhatkar

Wolfgang Dickenscheid

Wen Siang Lew

Yong Wee Francis Poh

Upinder Singh

Huajun Liu

Ulrike Bewersdorff-Sarlette

Alfred Vater

Sunoo Kim

Teck Guan Lim

Pengfei Guo

Zhiqiang Teo

Dong Wang

Yew Tuck Clament Chow

Pey Kin Leong

Wei Yi Lim

Michael Han Kim Kwong

Eva Wai Leong Ching

Yu Jin Eugene Kong

Myo Aung Maung Maung

In a non-limiting embodiment, a memory array is provided having a transistor device. The transistor device includes transistor device first, second and third doped regions in a substrate. The transistor device further includes a first transistor device select gate over a region between the transistor device first doped region and the transistor device second doped region, and a second transistor device select gate over a region between the transistor device first doped region and the transistor device third doped region. The transistor device further includes a transistor device dielectric barrier extending between the first transistor device select gate and the second transistor device select gate. A width of the dielectric barrier compared to a width of the first transistor device select gate and/or the second transistor device select gate may have a ratio ranging from 0.33:1 to 5:1.

Transistor device, memory arrays, and methods of forming the same

The present disclosure relates to split gate flash MLC based neuromorphic processing and method of making the same. Embodiments include MLC split-gate flash memory formed over a substrate, the MLC split-gate flash memory embedded with artificial neuromorphic processing to dynamically program and erase each cell of the MLC split-gate flash memory; and sense visual imagery by the artificial neuromorphic processing.

Neuromorphic memories with split gate flash multi-level cell and method of making the same

Devices and methods for forming a device are presented. The device includes a substrate having a well of a first polarity type and a thyristor-based memory cell. The thyristor-based memory cell includes at least a first region of a second polarity type adjacent to the well, a gate which serves as a second word line disposed on the substrate, at least a first layer of the first polarity type disposed adjacent to the first region of the second polarity type and adjacent to the gate, and at least a heavily doped first layer of the second polarity type disposed on the first layer of the first polarity type and adjacent to the gate. At least the heavily doped first layer of the second polarity type is self-aligned with side of the gate.

Methods of forming a thyristor-based random access memory using fin structures and elevated layers

Methodologies and an apparatus for enabling magnetic shielding of stand alone MRAM are provided. Embodiments include placing MRAM dies and logic dies on a first surface of a mold frame; forming a top magnetic shield over top and side surfaces of the MRAM dies; forming a mold cover over the MRAM dies, FinFET dies and mold frame; removing the mold frame to expose a bottom surface of the MRAM dies and FinFET dies; and forming a bottom magnetic shield over the bottom surface of the MRAM dies.

Magnetic shielding of STT-MRAM in multichip packaging and method of manufacturing the same

Methods of forming a MTJ dummy fill gradient across near-active-MRAM-cell periphery and far-outside-MRAM logic regions and the resulting device are provided. Embodiments include providing an embedded MRAM layout with near-active-MRAM-cell periphery logic and far-outside-MRAM logic regions; forming a MTJ structure within the layout based on minimum space and distance rules relative to a first metal layer, a second metal layer, and/or both the first and second metal layers; forming a high-density MTJ dummy structure in the near-active-MRAM-cell periphery logic region based on second minimum space and distance rules relative to a first metal layer, a second metal layer, and/or both the first metal layer and the second metal layer; and forming a low-density MTJ dummy structure in the far-outside-MRAM logic region based on third minimum space and distance rules relative to a first metal layer, a second metal layer, and/or both the first metal layer and the second metal layer.

Memory device with density-controllable dummy fill strategy for near-MRAM  periphery and far-outside-MRAM logic regions for embedded MRAM technology

Methods for preventing step-height difference of flash and logic gates in FinFET devices and related devices are provided. Embodiments include forming fins in flash and logic regions; recessing an oxide exposing an upper portion of the fins; forming an oxide liner over the upper portion in the flash region; forming a polysilicon gate over and perpendicular to the fins in both regions; removing the gate from the logic region and patterning the gate in the flash region forming a separate gate over each fin; forming an ONO layer over the gates in the flash region; forming a second polysilicon gate over and perpendicular to the fins in both regions; planarizing the second polysilicon gate exposing a portion of the ONO layer over the gates in the flash region; forming and patterning a hardmask, exposing STI regions between the flash and logic regions; and forming an ILD over the STI regions.

Method and device for embedding flash memory and logic integration in FinFET technology

A method of forming a memory cell with a high aspect ratio metal via formed underneath a metal tunnel junction (MTJ) and the resulting device are provided. Embodiments include a device having a metal via formed underneath a metal tunnel junction (MTJ) in a memory cell, and the metal via has an aspect ratio smaller than 2.

MTJ bottom metal via in a memory cell and method for producing the same

A method of forming a low-cost and compact hybrid SOI and bulk MTP cell and the resulting devices are provided. Embodiments include forming a bulk region in a SOI wafer; forming an NW in the bulk region and a PW in a remaining SOI region of the SOI wafer; forming first and second pairs of common FG stacks over both of the SOI and bulk regions; forming a first shared N+ RSD between each common FG stack of the first and second pairs in a top Si layer; forming a N+ RSD in the top Si layer of the SOI region on an opposite side of each common FG stack from the first shared N+ RSD; forming a second shared N+ RSD between each common FG stack in the bulk region; and forming a P+ RSD between the first and second pairs in the bulk region.

Low cost multiple-time programmable cell on silicon on insulator technology and method for producing the same

A method of forming an integrated circuit with a metal-insulator-poly (MIP) capacitor formed in a high-k metal gate (HKMG) process and the resulting device are provided. Embodiments include a device including a metal gate; a high-k dielectric layer formed around side walls of the metal gate, and a dummy polysilicon gate adjacent to at least one portion of the high-k dielectric layer. The device also includes a capacitor including the HK layer as an insulator, wherein the insulator is between a dummy as one electrode and the metal gate as another electrode.

Metal-insulator-poly capacitor in a high-K metal gate process and method of manufacturing

Devices and methods of forming a device. A two-terminal device element includes a device stack coupled between first and second terminals. The first terminal contacts a metal line in an underlying interconnect level, and the second terminal is formed over the device layer. An encapsulation liner covers exposed side surfaces of the device stack of the two-terminal device element. A dual damascene interconnect is coupled to the two-terminal device element.

Integrated two-terminal device with logic device for embedded application

Emerging memory chips and methods for forming an emerging memory chip are presented. For example, magnetic random access memory (MRAM) chip magnetic shielding and methods of forming a magnetic shield processed at the wafer-level are disclosed. The method includes providing a magnetic shield at the front side of the chip, back side of the chip, and also in the deep trenches surrounding or adjacent to magnetic tunnel junction (MTJ) array within the prime die region. Magnetic shield in the deep trenches connects front side and back side magnetic shield. This magnetic shielding method is applicable for both in-plane and perpendicular MRAM chips. The MTJ array is formed in the prime die region and in between adjacent inter layer dielectric (ILD) levels of the upper ILD layer in the back end of line (BEOL) of the MRAM chip.

MRAM chip magnetic shielding

Device and methods of forming a device are disclosed. The method includes providing a substrate and a first upper dielectric layer over first, second and third regions of the substrate. The first upper dielectric layer includes a first upper interconnect level with a plurality of metal lines in the first and second regions. A MRAM cell which includes a MTJ element sandwiched between top and bottom electrodes is formed in the second region. The bottom electrode is in direct contact with the metal line in the first upper interconnect level of the second region. A dielectric layer which includes a second upper interconnect level with a dual damascene interconnect in the first region and a damascene interconnect in the second region is provided over the first upper dielectric layer. The dual damascene interconnect in the first region is coupled to the metal line in the first region and the damascene interconnect in the second region is coupled to the MTJ element.

Integrated magnetic random access memory with logic device having low-K interconnects

Devices and methods of forming a device are disclosed. The method includes providing a substrate and a first upper dielectric layer over first and second regions of the substrate. The first upper dielectric layer includes a first upper interconnect level with a plurality of metal lines in the regions. A two-terminal device element which includes a device layer coupled in between first and second terminals is formed over the first upper dielectric layer in the second region. The first terminal contacts the metal line in the first upper interconnect level of the second region and the second terminal is formed on the device layer. An encapsulation liner covers at least exposed side surfaces of the device layer of the two-terminal device element. A dielectric layer which includes a second upper interconnect level with dual damascene interconnects is provided in the regions. The dual damascene interconnect in the first region is coupled to the metal line in the first region and the dual damascene interconnect in the second region is coupled to the two-terminal device element.

Shielded semiconductor devices and methods for fabricating shielded semiconductor devices are provided. An exemplary magnetically shielded semiconductor device includes a substrate having a top surface and a bottom surface. An electromagnetic-field-susceptible semiconductor component is located on and/or in the substrate. The magnetically shielded semiconductor device includes a top magnetic shield located over the top surface of the substrate. Further, the magnetically shielded semiconductor device includes a bottom magnetic shield located under the bottom surface of the substrate. Also, the magnetically shielded semiconductor device includes a sidewall magnetic shield located between the top magnetic shield and the bottom magnetic shield.

Shielded magnetoresistive random access memory devices and methods for fabricating the same

Integrated circuits and methods of producing the same are provided. In an exemplary embodiment, an integrated circuit includes a substrate and a fin extending from the substrate. The fin includes a first and second fin sidewall, and a memory cell layer is adjacent to the first and second fin sidewalls. A first control gate is adjacent to the memory cell layer where the memory cell layer is between the first fin sidewall and the first control gate. A second control gate is also adjacent to the memory cell layer, where the memory cell layer is between the second fin sidewall and the second control gate. The first and second control gates are electrically isolated from each other.

Integrated circuits with memory cells and method for producing the same

Growing community of inventors

Singapore, Singapore

Danny Pak-Chum Shum