Micron Technology Incorporated

Stmicroelectronics S.r.l.

Other

Micron Technoloy, Inc

Daniele Balluchi

Danilo Caraccio

Paolo Amato

Emanuele Confalonieri

Marco Dallabora

Marco Sforzin

Graziano Mirichigni

Dionisio Minopoli

Luca Porzio

Corrado Villa

Victor Y Tsai

Robert Warren

Neal Anthony Galbo

Roberto Izzi

Greg A Blodgett

Angelo Visconti

Giorgio Servalli

Daniele Vimercati

Umberto Di Vincenzo

Robert Nasry Hasbun

Gianfranco Ferrante

Marco Ferrario

William Yu

Antonino Caprí

Andrea Martinelli

Amitava Majumdar

Alessandro Orlando

Joemar Sinipete

Massimiliano Patriarca

Niccolò Izzo

Chris Bueb

Antonino Caprì

Mohammed Ebrahim Hargan

Ankush Lal

Anandhavel Nagendrakumar

Niccolo Izzo

Chia Wei Chang

Scott Garner

Jacob S Robertson

Thomas T Tangelder

James G Steele

Chad B Erickson

Danilo Carracio

A controller can be configured to enable a host to control media testing on a memory device. The interface between the host and the memory can be abstract, such that the host does not have direct control over the memory. Instead, the controller can provide translation between a host protocol, such as compute express link (CXL), and a memory protocol, such as a protocol to control a dual data rate (DDR) interface. The controller can enable media test capability discovery, configuration, and/or control for the host. The controller can enable media test result reporting from the memory to the host.

Host controlled media testing of memory

Address translation of host commands to access host data stored in memory devices that provides a chip kill capability not only involves locating where the host data is stored, but also involves locating where parity data striped with the host data is stored. In locating where the parity data is stored, the address translation can be performed with logical (e.g., arithmetic) operations.

Memory address translation for data protection and recovery

Systems, apparatuses, and methods related to memory bank protection are described. A quantity of errors within a single memory bank is determined and the determined quantity can be used to further determine whether to access other memory banks to correct the determined quantity. The memory bank protection described herein avoids a single memory bank of a memory die being a single point of failure (SPOF).

Memory bank protection

The present disclosure includes apparatuses and methods for command queuing. A number of embodiments include receiving a queued command request at a memory system from a host, sending a command response from the memory system to the host that indicates the memory system is ready to receive a command in a command queue of the memory system, and receiving, in response to sending the command response, a command descriptor block for the command at the memory system from the host.

Command queuing

Methods, systems, and devices related to built-in self-test (BIST) circuitry of a controller. The controller can be coupled to multiple memory devices. The BIST circuitry can include registers configured to store burst patterns. The BIST circuitry can perform a BIST operation on the memory devices contemporaneously and using the number of burst patterns.

Built-in self-test circuitry

Systems, apparatuses, and methods related to memory activation timing management are described herein. In an examples, memory activation timing management can include receiving a first command associated with a set of memory cells, activating the set of memory cells to perform a memory access responsive to the first command, pre-charging the set of memory cells associated with the first command, receiving a second command associated with the set of memory cells, determining that the set of memory cells associated with the first command is a recently activated set of the plurality of sets of memory cells, imparting a delay, and applying a sensing voltage to the set of memory cells associated with the second command to perform a memory access responsive to the second command.

Memory activation timing management

Methods, systems, and devices related to built-in self-test burst patterns based on architecture of memory. A controller can be coupled to a memory device. The controller can include built-in self-test (BIST) circuitry. The BIST circuitry can include registers configured to store respective write burst patterns and read burst patterns based on an architecture of the memory device.

Built-in self-test burst patterns based on architecture of memory

A channel width can depend on a quantity of memory units (e.g., memory dice) that forms a channel as well as a size of the memory units. A memory system can operate with memory units configured to exchange (e.g., transfer to and/or from) data at a rate of smaller granularity that can provide more various options for channel widths, which can further allow a fine-tuned optimization of the memory system in association with its bandwidth and latency in transferring data from and/or to the memory units. The channels whose channel width is fine-tuned with such memory units can be further used to provide a reliability, availability, and serviceability (RAS) protection, such as a redundant array of independent disks (RAID) protection.

Apparatus for redundant array of independent disks

Systems, apparatuses, and methods related to a flip-on-precharge disable operation are described herein. In an example, a method can include receiving a command to perform a precharge operation on a set of memory cells in a memory device. The memory device can include a plurality of sets of memory cells corresponding to respective portions of an array of memory cells of the memory device. The method can further include accessing one or more sets of bits in a mode register. The one or more sets of bits in the mode register indicate address locations of the plurality of sets of memory cells to disable the flip on precharge operation. The method can further include performing the precharge operation on the set of memory cells. The flip on precharge operation associated with the precharge operation can be disabled for those sets of the plurality of sets of memory cells whose address locations are in the mode register.

Adjustable memory cell reliability management

A soft post package repair (sPPR) request is detected. Data stored in a target row of a memory array associated with the sPPR request is written to a buffer. Execution of non-maintenance requests on the target row is suspended. Responsive to suspension of execution of non-maintenance requests on the target row, the sPPR request is executed on the target row. Subsequent to completion of the sPPR request, execution of non-maintenance requests on the target row is resumed and the data stored in the buffer is written to the repaired target row.

Post package repair management

The present disclosure includes apparatuses and methods for providing energy information to memory. An embodiment includes determining, by a host, that a charge level of an energy source coupled to the host has reached or exceeded a threshold value, and transmitting, from the host to a memory device coupled to the host, signaling indicative of an energy mode for the memory device, wherein the signaling is transmitted based at least in part on determining that the charge level of the energy source has reached or exceeded the threshold.

Providing energy information to memory

An apparatus can include a number of memory devices and a memory controller coupled to one or more of the number of memory devices. The memory controller can include a row hammer detector. The memory controller can be configured increment for a first time period a row counter in a first data structure and a refresh counter. The memory controller can be configured to increment for a second time period a row counter in a second data structure and the refresh counter. The memory controller can be configured to determine that a value of the refresh counter exceeds a refresh threshold and responsive to the determination that the value of the refresh counter exceeds the refresh threshold, issue a notification.

Row hammer telemetry

Systems, apparatuses, and methods related to a flip-on-precharge disable operation are described herein. In an example, a flip-on-precharge disable operation can include activating a set of memory cells in a memory device to perform a memory access. The memory device can include a plurality of sets of memory cells corresponding to respective portions of an array of memory cells of the memory device. The flip-on-precharge disable operation can further include receiving signaling indicative of a command for a precharge operation on a set of the plurality of sets of memory cells. The signaling can include one or more bits that indicates whether to disable a randomly performed flip operation on the set of memory cells. The flip-on-precharge disable operation can include, in response to the one or more bits indicating to disable the flip operation, performing the precharge operation without randomly performing the flip operation on the set of memory cells.

Strategic memory cell reliability management

Systems, apparatuses, and methods related to a controller for managing multiple types of memory are described. A controller includes a front end portion, a central controller portion, a back end portion, and a management unit can manage a first type of memory device that operates according to a first set of timing characteristics and a second type of memory device that operates according to a second set of timing characteristics. The central controller portion is configured to cause performance of a memory operation and comprises a cache memory to buffer data associated performance of the memory operation, a security component configured to encrypt the data before storing the data in the first type of memory device or the second type of memory device, and error correction code (ECC) circuitry to ECC encode and ECC decode the data.

Controller for managing multiple types of memory

A method including obtaining temperature values of at least one region of the non-volatile memory, each temperature value obtained at a given time instant, for each obtained temperature value at each given time instant, calculating the value of an operating function representative of an operating condition of the non-volatile memory, the value such operating function being time-dependent according to the temperature time-variation of such at least one region of the non-volatile memory, summing subsequent computed values of said operating function to obtain an accumulated value being representative of an elapsed fraction of a time limit associated with the at least one region of the non-volatile memory, comparing the accumulated value with a threshold value, and, based on said comparison, performing a management operation on the cells of the at least one region of the non-volatile memory when the accumulated value has a magnitude equal or greater than the threshold value.

Methods, devices and systems for an improved management of a non-volatile memory

Growing community of inventors

Cernusco sul Naviglio, Italy

Daniele Balluchi