Yeda Research and Develpment & Co. Ltd

Daniel Zajfman

Irit Sagi

Zeev Vager

Yinon Rudich

Michael Rappaport

Henrik B Pedersen

Oded Heber

Oded Herber

A method for trapping of a plurality of charged particles in a charged particle trap. The trap includes first and second electrode mirrors having a common optical axis, the mirrors being arranged in alignment at two extremities thereof. The mirrors are capable, when voltage is applied thereto, of creating respective electric fields defined by key field parameters. The electric fields are configured to reflect charged particles causing their oscillation between the mirrors. The method includes introducing into the trap, along the optical axis, the plurality of charged particles as a beam having pre-determined key beam parameters. The method further includes choosing the key field parameters for at least one of the mirrors such as to induce bunching among charged particles in the beam.

Ion trapping

System and a method of three-dimensional imaging

Growing community of inventors

Rehovot, Israel

Daniel Zajfman