N K Technology Ltd

Finisar Corporation

Tecan Trading Ag

Daniel Tran

Ting Shi

Manjeet Dhindsa

Pavel Ploscariu

Patrick D Kinney

Sujata Iyer

Thomas D Perroud

Marc T Aho

Daniel Hoffmeyer

Tiffany Lay

Tiffany Ding (Lay)

Tin Ngo

Jennifer Ji

A cartridge, in particular a disposable cartridge, for use in an electrowetting sample processing system. The cartridge has a liquid input port for introducing an input liquid into an internal gap of the cartridge, the input liquid providing for at least one droplet, directly or via a liquid separation process within the internal gap, and the internal gap having at least one hydrophobic surface, at least one processing zone for processing samples located in the processing zone, and a delivery zone for delivering the at least one droplet from the liquid input port to the at least one processing zone. The delivery zone is configured to provide a repeating pattern of interacting electrowetting force for simultaneously transporting the at least one droplet within the delivery zone.

Cartridge and electrowetting sample processing system with delivery zone

Digital microfluidics system with electrodes attached to a PCB has control unit for manipulating liquid droplets by electrowetting, cartridge accommodation site for taking up a disposable cartridge having a working gap in-between two hydrophobic surfaces, and magnetic conduit/backing combination. A barrier element on an individual electrode of the PCB for narrowing the working gap. A disposable cartridge is positioned at the cartridge accommodation site, its flexible working film touching there and of the barrier element an uppermost surface. In the working gap and above a path of selected electrodes a liquid portion or liquid droplet with magnetically responsive beads moves by electrowetting on the electrode path until a magnetic field of the magnetic conduit is reached. The backing magnet is activated before and during the moving to thereby attract and remove magnetically responsive beads therefrom.

Bead separation in microfluidics

A vacuum assisted disc clamping device provides a number of fixture rings preferably concentrically stacked on a fixture body that is moveable in fixture ring stacking direction and actuated by a wedge drive to compensate for varying fixture levels associated with the individual fixture rings and disc standards. Each fixture ring includes a planar flange with a vacuum groove and a central conical portion that rises above the planar flange. The conical portion is defined with a diameter and cone angle such that a disc of corresponding dimensional standard may be readily placed on the fitting fixture ring with the disc bottom being sucked onto the planar flange while the disc hole centers on the conical portion.

Disc clamping device for multiple standard discs

Systems for automated laser header testing are disclosed. A system can include a base portion, a rotary stage supported by the base portion, at least one testing site supported by the rotary stage, and a plurality of testing stations supported by the base portion and radially arranged about a center point of the rotary stage for testing the laser header. Each testing site can include a testing fixture supported by the testing site. The testing fixture can include an air shield providing an isolated environment for testing the laser header. The testing fixture can further include a heat sink and air ducts for controlling testing conditions. Electrical contact members can releasably contact leads of the laser header and a releasing mechanism releases the leads of the laser header from the electrical contact members.

Automated laser header testing

A temperature-controlled system for testing a laser die mounted on a submount is disclosed. The testing system comprises a base having a motor-driven translation platform. The translation platform includes a first testing site having a two-stage temperature control system mounted on a base portion. The temperature control system includes a thermoelectric cooler and a fluid system for circulating a cooling/heating fluid in a circulation block. A mounting portion is also included on the first testing site on which the submount is positioned. The temperature of the mounting portion is controlled by the temperature control system. A probe card having an arm and an electrical contact portion attached to the arm provides a power supply to the submount when the first testing site is aligned with the probe card. An aligner having a lens assembly that is alignable with the first testing site receives an optical signal produced by the laser.

Automated characterization system for laser chip on a submount

A flipper for rotating and positioning a photomask in two flip orientations includes a flip unit rotatably held in a base. The flip unit includes a flip frame in which clamps are preferably spring loaded guided such that the clamps are oppositely and laterally displaceable between engaged positions and parking positions. A stepper motor rotates the flip unit between two flip orientations and positions the flip unit such that opposite inspection sides of the work piece are alternately oriented with respect to a single inspection direction. The flipper may be placed on or adjacent to a stage system of an inspection device. A robotically actuated effector may access the flipper for loading and unloading the work piece. In combination with an effector operating without lift motion, the clamps may feature wedge lift faces to lift the work piece off the effector during their actuation into engaged position.

Photomask flipper and single direction inspection device for dual side photomask inspection

A compact pinlifter assembly is fitted in a substantially enclosed cavity within a wafer chuck such that an overall outside shape of the wafer chuck remains highly unaffected. The pinlifter assembly includes wedge guides providing a movement path in a wedge angle relative to the wafer holding face. A pin actuator is driven along the wedge guides transforming its movement along the wedge guides into a vertical movement of the lifting pins perpendicularly sliding between the cavity and the wafer holding face. The combination of wedge guides and pin actuator takes advantage of the relatively large lateral dimensions of the wafer chuck to move the pin actuator between end positions that are in a distance multiple of the pin lifters movement. Due to the wedge angle, the actuators comparatively large scale movement is transformed in a highly precise, smooth and balanced movement of the pin lifters.

Compact pinlifter assembly integrated in wafer chuck

A system for docking a floating test stage with integrated testing equipment to a predetermined position relative to a terrestrial base is described. The system includes a cylinder for docking the test stage to the predetermined position and a vibration isolation system for isolating the test stage when it is floating over the base. The system also includes a handling unit indexed to the predetermined position for loading and unloading samples on the test stage.

Growing community of inventors

San Jose, CA, United States of America

Daniel Tran