Protochips, Inc.

Parata Systems, LLC

Daniel Stephen Gardiner

John Damiano, Jr

Franklin Stampley Walden, Ii

David P Nackashi

Mark Alan Uebel

William Bradford Carpenter

Alan Philip Franks

Benjamin Jacobs

Joshua Friend

Katherine Elizabeth Marusak

Dennis H Vaders

Nelson L Marthe, Jr

Benjamin Bradshaw Larson

Matthew P Daniels

George Raymond Abrams, Jr

John Richard Sink

Edward Joseph Karwacki, Jr

Bryan Patrick Farnsworth

Mark I Perisich

Jody B DuMond

Bradley Kenneth Smith

Michael Zapata, Iii

Michael Richard Floyd

Weldon Curl, Jr

Mark Longley

Jeffrey J Schedel

Craig Steven Davis

Timothy Ulm

James Rivenbark

Gerald Cooper Ushery, Jr

Nanette Kirsch

Rebecca Thomas

Jennifer Ann Mauger

Kurt Kulberg

Ii Franklin Stampley Walden

Jr John Damiano

John Damiano Jr

Franklin Stampley Walden Ii

Control system configured for sample tracking in an electron microscope environment registers a movement associated with a region of interest located within an active area of a sample under observation with an electron microscope. The registered movement includes at least one directional constituent. The region of interest is positioned within a field of view of the electron microscope. The control system directs an adjustment of the electron microscope control component to one or more of dynamically center and dynamically focus the view through the electron microscope of the region of interest. The adjustment comprises one or more of a magnitude element and a direction element.

Automated application of drift correction to sample studied under electron microscope

Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.

Disclosed herein are methods and systems of metadata management for reviewing data from microscopy experimental sessions. Image data from an experimental session is stored in an archive at one or more filepath locations, either locally or on a network. Metadata associated with the image data is stored in a database with a reference to the filepath where the raw image is stored, such that the metadata is associated in the database with the image data. A user can perform post-experimental filtering, sorting, and searching of the underlying image data using the metadata, which allows the image data to be analyzed without duplication of the image data and without manual review of each individual image. The filtered data is presented in an interactive timeline format.

Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessions

A fluid metering system for gas independent pressure and flow control through an electron microscope sample holder includes: a pressure control system that supplies gas; an inlet line providing gas from the pressure control system to the sample holder; an outlet line receiving gas from the sample holder; and a variable leak valve that controls gas flow in the outlet line. The gas flows from an upstream tank of the pressure control system through the sample holder and variable leak valve to a downstream tank of the pressure control system due to the pressure difference of the two tanks as the variable leak valve meters flow in the outlet line. Flow rates are established by monitoring pressure changes at source and collection tanks of known volumes with gas independent pressure gauges. A method of directing the gas flow to a residual gas analyzer (RGA) is also presented.

Electron microscope sample holder fluid handling with independent pressure and flow control

A heating device having a heating element patterned into a robust MEMs substrate, wherein the heating element is electrically isolated from a fluid reservoir or bulk conductive sample, but close enough in proximity to an imagable window/area having the fluid or sample thereon, such that the sample is heated through conduction. The heating device can be used in a microscope sample holder, e.g., for SEM, TEM, STEM, X-ray synchrotron, scanning probe microscopy, and optical microscopy.

MEMS frame heating platform for electron imagable fluid reservoirs or larger conductive samples

MEMs frame heating platform for electron imagable fluid reservoirs or larger conductive samples

Growing community of inventors

Wake Forest, NC, United States of America

Daniel Stephen Gardiner