Marvell International Limited

Daniel Smathers

Saeed Azimi

Son Hong Ho

A system on a chip including a processor and an in-circuit emulator located within the processor. The processor is to perform processing functions associated with controlling operation of the system on a chip. The in-circuit emulator includes instrumentation logic to take over controlling the operation of the SOC from the processor, perform debugging and emulation functions, and output data including results of the debugging and emulation functions. A frame capture module is to package the data including the results of the debugging and emulation functions into frames having a parallel format. A serializer is to convert the frames from the parallel format to a serial format and output the frames having the serial format from the system on a chip.

System and method for transferring serialized test result data from a system on a chip

A serializer/deserializer for communicating with an integrated circuit. The serializer/deserializer includes a serializer configured to serialize, from a parallel format into a serial format, first data to be transferred from an external device to the integrated circuit. The external device is configured to perform testing on the integrated circuit. A deserializer is configured to deserialize, from the serial format into the parallel format, second data to be transferred from the integrated circuit to the external device. A test access port module is configured to receive, from a test interface arranged between the serializer/deserializer and the external device, third data for controlling the serializer and provide, to the test interface, fourth data associated with control of the test interface. The fourth data corresponds to the deserialization of the second data to be transferred from the integrated circuit to the external device.

Serializer/deserializer and method for transferring data between an integrated circuit and a test interface

A system for providing a test result from an integrated circuit to a status analyzer. A deserializer is configured to deserialize, into data frames, messages received from the integrated circuit. The messages include the test result and are received from the integrated circuit in a serial data format. A frame sync module is configured to synchronize the data frames, output the synchronized data frames, and generate a clock signal. A gateway module is configured to receive the synchronized data frames from the frame sync module in accordance with the clock signal, convert signal levels and signal timings associated with the synchronized data frames from a first format used by the frame sync module to a second format used by the status analyzer, and provide the synchronized data frames to the status analyzer in accordance with the signal levels and the signal timings in the second format used by the status analyzer.

System and method for providing a test result from an integrated to an analyzer

A system for testing an integrated circuit, in which the system includes a deserializer, a frame sync module, and a diagnostic module. The deserializer is external to the integrated circuit and is configured to receive messages in a serial data format, wherein the messages include test results associated with the integrated circuit, and deserialize the messages into data frames. The frame sync module is configured to provide control code based on the data frames, wherein the control code includes, in a digital format, status information associated with the messages deserialized into the data frames. The diagnostic module is configured to generate, based on the control code, diagnostic data associated with states of the integrated circuit.

System and method for testing an integrated circuit embedded in a system on a chip

A system including a frame capture module, a serializer, and a deserializer. The frame capture module is configured to receive, from a device under test, data corresponding to test results, and package the data into first data frames. The serializer is configured serialize the first data frames to form serial messages that include serialized data. The serializer includes i) a first serial link configured to output the serial messages according to a first clock domain, and ii) a second serial link configured to output the serial messages according to a second clock domain. The deserializer is configured to deserialize the serial messages received on the first serial link and the second serial link to form second data frames.

Apparatus and method for testing and debugging an integrated circuit

A system receives serial messages from a device under test. The system includes a deserializer configured to i) receive the serial messages and, ii) based on the serial messages, form data frames. A frame sync module is configured to form Joint Task Action Group (JTAG) data bits based on the data frames. A plurality of virtual JTAG test access ports are configured to i) receive the JTAG data bits and ii) shift the JTAG data bits between the plurality of virtual JTAG test access ports.

A system for receiving serial messages from a device under test includes a deserializer configured to i) receive the serial messages and, ii) based on the serial messages, form data frames. A frame sync module is configured to form Joint Task Action Group (JTAG) data bits based on the data frames. A plurality of virtual JTAG test access ports are configured to i) receive the JTAG data bits and ii) shift the JTAG data bits between the plurality of virtual JTAG test access ports.

A system for receiving Joint Task Action Group (JTAG) data bits from a device under test includes a deserializer that receives serial messages from the device under test and forms data frames based on the serial messages. A frame sync module communicates with the deserializer and forms JTAG data bits based on the data frames. N virtual JTAG test access ports (VTAPs), each having an input and an output. The N VTAPs are connected in a daisy chain and the input of a first VTAP receives the JTAG data bits from the frame sync module.

An integrated circuit includes a first deserializer that deserializes serial data containing at least one of test instructions and/or data in a first format. A monitor module communicates with the first deserializer and interprets the test instructions and data using the first format. A frame capture module receives test results according to the interpreted test instructions and data. A first control module communicates with the frame capture module and generates first format control data. The frame capture module packages the test results and the first format control data into frames. A first serializer serializes the frames.

An interface that communicates with first and second interface modules, an analyzer and an integrated circuit comprises a first path from the first and second interface modules and the analyzer to the integrated circuit. The first path includes a first serializer that serializes at least one of first control data and/or test data from at least one of the first and/or second interface modules. A second path from the integrated circuit to the first and second interface modules and the analyzer includes a high speed deserializer that deserializes serial data containing at least one of test result data and/or second control data from the integrated circuit. A frame sync module synchronizes data from the high speed deserializer to identify frames. The high speed deserializer outputs the second control data to at least one of the first and/or second interface modules. The frame sync module outputs the frames to the analyzer.

A system is provided that retrieves test information from a target integrated circuit. A serializer receives the test information in a first format and divides and reformats the test information into first and second serial messages. The serializer is located on the target integrated circuit and has a first serial output that sends the first serial message and a second serial output that sends the second serial message. A deserializer communicates with the first and second serial outputs and receives the first and second serial messages. The deserializer retrieves a first portion of the test information from the first serial message, a second portion of the test information from the second serial message, and reconstructs the test information from the first portion and the second portion.

A system for testing a target integrated circuit comprises a host device that executes a debugging and testing analysis program, that transmits test instructions and data to the integrated circuit and that analyzes received data from the target integrated circuit. A first interface module communicates with the host device and formats the test instructions and data using a first format. A first serializer serializes the test instructions and data. A first deserializer on the target integrated circuit communicates with the first serializer and deserializes the test instructions and data. A control module on the target integrated circuit communicates with the first deserializer, interprets the test instructions and data using the first format. A testing module receives the interpreted test instructions and data from the control module and performs testing and debugging of the target integrated circuit.

Growing community of inventors

Boulder, CO, United States of America

Daniel Smathers