Varian Medical Systems, Inc.

Varex Imaging Corporation

University of Florida Research Foundation, Incorporated

The Boeing Company

Nucsafe, Inc.

Ut-battelle, Inc.

Gas Technology Institute

Collimated Holes, Inc.

Daniel Shedlock

Josh Star-Lack

David T Nisius

Gary Fredric Virshup

Alan M Jacobs

Edward T Dugan

James Edward Clayton

Gregory C Andrews

William Talion Edwards

Adam Shar Wang

Gary E Georgeson

Morteza Safai

Richard E Colbeth

Eric Abel

Daniel Morf

Timothy R Fox

Mingshan Sun

Keith Vaigneur

Viktor Steinlin

Michael Liesenfelt

Daniel F Hollenbach

Matthias Ehrat

Richard Mead

Jeffrey Allen Chapman

John E Gunning

Larry J Ott

Samuel Donnald

Christopher Meng

Nissia Sabri

Andrew Hammerschmidt

Andre Meyer

Sharon Auerback Jacobs

Jeff Adams

Michael Stamm

Josh M Star-Lack

An imaging system for inspecting multiple objects includes an x-ray source having a beam width greater than or equal to a threshold beam size. The multiple objects is irradiated by the x-ray source in respective controlled inspection positions. A detection mechanism is adapted to acquire respective images of the multiple objects in the respective controlled inspection positions. The detection mechanism includes one or more detectors arranged circumferentially around a central axis. At least one positioning mechanism is adapted to move the multiple objects into and out of the respective controlled inspection positions.

Imaging system with wide x-ray beam and circumferentially arranged detection mechanism

An x-ray system, comprising: a backscatter detector, comprising: an x-ray conversion material; a plurality of sensors configured to generate electrical signals in combination with the x-ray conversion material in response to incident x-rays; and a collimator disposed on the x-ray conversion material and including a plurality of partitions extending away from the x-ray conversion material and the sensors and forming a plurality of openings, each opening corresponding to one of the sensors.

Backscatter imaging system

In a method of making pixelated scintillators, an amorphous scintillator material in a molten state is pressed into a plurality of cavities defined by a plurality of walls of a mesh array. The molten scintillator material in the plurality of cavities is cooled to form a pixelated scintillator array. An x-ray imager including a pixelated scintillator is also described.

Method for fabricating pixelated scintillators

Technology is described to uniformly apply doses of radiation to a target material. An irradiation device may comprise an enclosure configured to receive a target material and a source configured to emit primary radiation within the enclosure. The primary radiation may be configured to irradiate at least a first portion of the target material. The irradiation device may further comprise a scattering medium disposed within the enclosure. The scattering medium may be configured to produce secondary radiation through scatter interactions in response to the primary radiation, the secondary radiation configured to irradiate at least a second portion of the target material. A thickness of the scattering medium relative to the primary radiation may have a thickness of at least 3 millimeters).

Systems and methods for irradiation

An imaging device includes: a scintillator layer; and an array of photodiode elements; wherein the scintillator layer is configured to receive radiation that has passed through the array of photodiode elements. An imaging device includes: a scintillator layer having a plurality of scintillator elements configured to convert radiation into photons; and an array of photodiode elements configured to receive photons from the scintillator layer, and generate electrical signals in response to the received photons; wherein at least two of the scintillator elements are separated by an air gap. An imaging device includes: a first scintillator layer having a plurality of scintillator elements arranged in a first plane; and a second scintillator layer having a plurality of scintillator elements arranged in a second plane; wherein the first scintillator layer and the second scintillator layer are arranged next to each other and form a non-zero angle relative to each other.

High DQE imaging device

In a method of making pixelated scintillators, a block of an amorphous scintillator material is divided into plural sections. The plural sections of the block are rejoined with plural first reflective septa to form an assembly. In the assembly, each of the plural first reflective septa separates two adjacent sections of the block. The assembly is then divided into plural sections in a way such that each of the plural sections of the block is divided into plural pixels. The plural sections of the assembly are rejoined with plural second reflective septa. Each of the plural second reflective septa separates two adjacent sections of the assembly, forming an array comprising plural rows and columns of pixels of the amorphous scintillator material. In the array, each pixel is separated from adjacent pixels by a portion of at least one of the plural first reflective septa and at least one of the second reflective septa.

Scintillating glass pixelated imager

A system operable for detecting radiation to scan an object includes scintillators that have respective lengths that are greater than their respective widths and an imager that has a planar array of pixels. The scintillators are coupled to the imager with their respective longitudinal axes parallel to each other. An incoming radiation beam that has passed through the object enters the scintillators through respective surfaces of the scintillators that are transverse to the longitudinal axes, and is converted by the scintillators into light that is received by respective subsets of the planar array of pixels.

Radiation detector and scanner

A method of making pixelated scintillator arrays employs a first jig comprising a plurality of recesses and a second jig comprising a plurality of recesses. A plurality of or N scintillator pixels are placed in a plurality of or N recesses of the first jig. The N scintillator pixels have a shape such that a portion of each of the N scintillator pixels is conformably received in one of the N recesses of the first jig, e.g. a portion of each of the N scintillator pixels is received in and conforms to the shape of one of the N recesses. The remaining portion of each of the N scintillator pixels protrudes out from the recess, forming N protrusions substantially conforming to the shape of the recesses of the second jig. An adhesive layer is applied on the N protrusions of the N scintillator pixels. A reflective layer is placed over the N protrusions of the N scintillator pixels. The recesses of the second jig are aligned with the N protrusions of the N scintillator pixels and the reflective layer is pressed with the second jig such that at least a portion of the reflective layer conforms to the N protrusions of the N scintillator pixels, forming a first row of a scintillator array comprising the N scintillator pixels and the at least portion of the reflective layer.

Methods for fabricating pixelated scintillator arrays

A method and apparatus for inspecting an object is present. Radiation is emitted from a radiation source. A beam is formed from a portion of the radiation emitted by the radiation source using a collimator. The collimator is connected to the radiation source by a bearing system comprising a first structure associated with the radiation source and a second structure connected to the first structure. The second structure is configured to hold the collimator. The second structure of the bearing system is moved using a movement system such that the second structure rotates in one of a plurality of directions substantially about a center point in the radiation source while the radiation source remains stationary relative to the second structure. Rotation of the second structure substantially about the center point in the radiation source changes a direction in which the beam is directed.

Single beam backscatter x-ray system

Methods and systems for scanning objects comprising scanning a portion of an object by a first radiation beam having a first value of a beam characteristic, such as the dose, and detecting the first radiation beam after interaction with the object by a first detector. It is determined whether to change the first value to a second value based, at least in part, on the detected first radiation beam. That portion of the object is then scanned by a second radiation beam having the first value or the second value based on the determination. The second radiation is detected after interacting with the object by a second detector. The second detector may have a second resolution greater than a first resolution of the first detector. The first and second radiation beams may be formed by first and second slots angled with respect to each other.

Feedback modulated radiation scanning systems and methods for reduced radiological footprint

The energy of an X-ray beam and critical depth are selected to detect structural discontinuities in a material having an atomic number Z of 57 or greater. The critical depth is selected by adjusting the geometry of a collimator that blocks backscattered radiation so that backscattered X-ray originating from a depth less than the critical depth is not detected. Structures of Lanthanides and Actinides, including nuclear fuel rod materials, can be inspected for structural discontinuities such as gaps, cracks, and chipping employing the backscattered X-ray.

X-ray backscatter imaging of nuclear materials

Systems and methods of x-ray backscatter radiography are provided. A single-sided, non-destructive imaging technique utilizing x-ray radiation to image subsurface features is disclosed, capable of scanning a region using a fan beam aperture and gathering data using rotational motion.

Method and apparatus for computed imaging backscatter radiography

Systems and methods for scanning an object in an inspection space are disclosed. The systems and methods generally incorporate spatially separated and sequenced Compton x-ray backscatter imaging techniques in a plurality of perspective planes. Such processes as time-gating detectors, weighting scintillation detections, and preferentially accepting signals that originate from a point that is substantially orthogonal to a radiation detector and at least partially shielding out signals that do not originate from a point substantially orthogonal to the detector may be used to enhance the data acquisition process.

Spatial sequenced backscatter portal

An apparatus for inspection in situ of a wellbore casing and a pipeline from inside the wellbore or pipeline. The apparatus includes a penetrating radiation source such as x-rays, a rotatable beam collimator adapted to collimate the penetrating radiation source and produce at least one pencil radiation beam rotatable about the radiation source, an arcuate radiation detector suitable for detecting radiation scattered off a target, and a housing containing the radiation source, the rotatable beam collimator, and the radiation detector. The housing is provided with at least one exit point for exiting of the at least one pencil radiation beam from the housing.

X-ray backscatter device for wellbore casing and pipeline inspection

Growing community of inventors

Knoxville, TN, United States of America

Daniel Shedlock