General Electric Company

Other

Daniel Scott Groninger

Robert Carroll Ward

Francois Xavier De Fromont

Chad Martin Shaffer

Soundarrajan Kaliaperumal

Galen Lee Swyers

David George Perrett

An inspection system, in an embodiment, can be operable with a probe and a position tracker to inspect an object. The system can be operable to display at least one probe travel axis, receive first and second inspection values from the probe, associate the first inspection value with a first position point, and associate the second inspection value with a second position point. The system displays an inspection path based on the associations. The inspection path extends relative to the probe travel axis.

Inspection path display

A testing system for use in conducting testing of a structure, and a method for configuring a testing system are provided. The testing system includes a testing device that includes a presentation interface, a user input interface, a memory device and a processor coupled in communication with the presentation interface, the user input interface, and the memory device. The processor causes the testing device to present to a user, prior to a test session, at least one demonstrative instruction for conducting a test session using the testing device, and at least one test instruction for use while the user is conducting a test session using the device.

Testing system and method

A method and system for dynamically adjusting a gain of an eddy current device are provided. The method includes providing calibration information to the eddy current device using a probe and switching between a first mode and a second mode of the eddy current device, the first mode exciting only a first coil to measure liftoff of the probe from a surface of a workpiece, the second mode exciting the first coil and a second coil to measure dimensions of a flaw within a workpiece. The method also includes determining a thickness of a non-conductive coating covering at least a portion of the workpiece using the first coil, adjusting a gain setting of the eddy current device based on the determined thickness and the calibration information, and determining dimensions of the flaw using the first and second coils and the adjusted gain setting.

Method and system for eddy current device dynamic gain adjustment

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Port Royal, PA, United States of America

Daniel Scott Groninger