Siemens Aktiengesellschaft

Daniel Schneegass

Peng Wei Tian

Cong Chao Li

Ying Qu

Cheng Feng

Ruo Gu Sheng

Chang Wei Loh

Chao Hua Wu

Yue Yu

A workpiece data processing method and apparatus are for accurately determining a relationship between production equipment processing parameters/ambient condition data and workpiece quality inspection results. A workpiece data method includes acquiring processing condition data, a quality attribute value and quality inspection result data of each of multiple workpieces processed by a piece of production equipment, the processing condition data of one workpiece including a processing parameter used by the production equipment when processing the workpiece and ambient condition data of the production equipment when processing the workpiece; determining a first relationship between the quality attribute value of the workpiece processed by the production equipment and the ambient condition data of the production equipment when processing the workpiece and the processing parameter of the production equipment; and determining a second relationship between the quality inspection result data and quality attribute value of the workpiece processed by the production equipment.

Method and apparatus for configuring processing parameters of production equipment, and computer-readable medium

An industrial device matching method and apparatus are used for acquiring a corresponding relationship between industrial devices in different industrial data sources to provide basis for industrial data analysis. The method, in an embodiment, includes collecting data of at least two industrial data sources; determining a first relationship between various industrial devices in each industrial data source, and determining a first relationship topology between the industrial devices in the industrial data source; and comparing the first relationship topologies corresponding to various industrial data sources, to determine a first corresponding relationship between industrial devices in industrial data sources, the first corresponding relationship enabling the first relationship topologies corresponding to at least two industrial data sources to be similar. A relationship between industrial devices in different industrial data sources is determined by comparing a relationship topology between devices according to the similarity of relationships between the devices in different industrial data sources.

Industrial device matching method and apparatus

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Beijing, China

Daniel Schneegass