Intel Corporation

Daniel Sanchez

Xavier Vera

Javier Carretero Casado

Enric Herrero Abellanas

Tanausu Ramirez

Nicholas Axelos

A system, processor and method to reduce the overall detectable unrecoverable FIT rate of a cache by reducing the residency time of dirty lines in a cache. This is accomplished through selectively choosing different replacement policies during execution based on the DUE FIT target of the system. System performance and power is minimally affected while effectively reducing the DUE FIT rate.

Increased error correction for cache memories through adaptive replacement policies

A method of determining vulnerability of a cache memory includes associating a first counter with a cache element and periodically incrementing the first counter. When a read or other access that consumes the data in the cache element occurs, a current value of the first counter is accumulated. When a write or other cache access that modifies data in the cache element occurs, the first counter is reset. At the end of an evaluation period, the value in a total counter approximates the number of clock cycles during which data that was consumed was vulnerable. Dividing this value by the number of clock cycles approximates the vulnerability of this cache element. The vulnerability for a subset of all cache elements may be measured and extrapolated to obtain an estimate for the vulnerability of the cache memory as a whole.

Vulnerability estimation for cache memory

Embodiments of apparatuses, methods, and storage medium associated with selectively providing error correction to memory are disclosed herein. In one instance, an apparatus may include a memory controller configured to control access to a non-volatile memory having storage locations. The controller may be configured to provide a first error correction arrangement to provide a first level of error correction capability for data stored in the non-volatile memory. The memory controller may include a control/error correction block configured to provide a second error correction arrangement with a second level of error correction capability for data stored in the non-volatile memory. The second level of error correction capability enables correction of at least one bit error more than the first level. The memory controller may be configured to selectively employ the second error correction arrangement to complement the first error correction arrangement. Other embodiments may be described and claimed.

Selective provision of error correction for memory

In one embodiment, a processor includes at least one functional block and banking logic. The banking logic may be to determine an average reliability metric associated with the at least one functional block. The banking logic may also be to, if the average reliability metric exceeds a required level, implement a reduced reliability mode in the at least one functional block, where the reduced reliability mode is associated with a reduction in the average reliability metric. Other embodiments are described and claimed.

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L'Hospitalet de Llobregat, Spain

Daniel Sanchez