Micron Technology Incorporated

Other

Daniel S Miller

Yoshinori Fujiwara

Jason M Johnson

Kevin Gustav Werhane

Christopher Gordon Wieduwilt

Takuya Tamano

Vivek Kotti

Joshua E Alzheimer

Dennis G Montierth

Minoru Someya

C Omar Benitez

Kari Crane

Tyrel Z Jensen

Dave Jefferson

David E Jefferson

Anne Kintner

Christopher S Wieduwilt

Methods, apparatuses, and systems may implement adjusted circuit tests. A memory device may include a self-test circuit that is configured to selectively suspend collection and/or processing of test results for one or more portions of the self-test.

Apparatus with adjustable diagnostic mechanism and methods for operating the same

An electronic device includes multiple memory elements including multiple redundant memory elements. The electronic device also includes repair circuitry configured to remap data to the multiple memory elements when a failure occurs. The repair circuitry includes multiple fuse latches configured to implement the remapping. The repair circuitry also includes latch testing circuitry configured to test functionality of the multiple fuse latches. The latch testing circuitry includes selection circuitry configured to enable selection of a first set of fuse latches of the multiple fuse latches for a test separate from a second set of fuse latches of the multiple fuse latches that are unselected by the selection circuitry.

Systems and methods for testing redundant fuse latches in a memory device

An apparatus includes a TM control circuit that is configured to receive address information corresponding to a TM function and compare the address information with an authorized TM list stored in a memory of the apparatus to determine if there is a match. If there is a match, a latch load signal pulse is output. A TM latch circuit programs one or more latches based on the address information and based on the latch load signal pulse. The TM latch circuit decodes information in the one or more latches and, based on the decoded information, outputs a test mode signal to turn on test mode operations in circuits associated with the TM function. The apparatus includes a plurality of TM functions for testing various features of the apparatus and the authorized TM list identifies which of the plurality of TM functions has been authorized for customer use.

Test mode security circuit

A delay circuit is coupled to a memory device. At least a portion of the delay circuit is disposed in one or more memory banks on one or more memory chips of the memory device. The delay circuit is configured to calibrate an asynchronous signal received at each of the one or more memory banks so that the calibrated asynchronous signal has a common timing relationship with a respective internal command signal received at the corresponding memory bank for all of the one or more memory banks on the memory device. The calibrated asynchronous signals are used in various internal test operations to improve testing accuracy.

Asynchronous signal to command timing calibration for testing accuracy

An apparatus with a memory array having a plurality of memory cells. The apparatus also including a memory built-in self-test circuit to test the memory array. The memory built-in self-test circuit includes one or more processing devices to write a data pattern to one or more memory cells to be tested in the memory array, pause for a time period corresponding to a predetermined pause time setting, and read the written data pattern from the one or more memory cells after the time period has elapsed. The predetermined pause time setting is automatically adjusted based on memory device conditions, which can include the temperature of the apparatus.

Memory built-in self-test with adjustable pause time

Serial interfaces with shadow registers, and associated systems, devices, and methods are described herein. In one embodiment, a serial interface is an IEEE 1500 interface, such as of an interface die of a high bandwidth memory (HBM) device. The IEEE 1500 interface includes (a) a primary wrapper data register (WDR) configured to store first information received in a first wrapper serial input (WSI) signal, (b) a shadow WDR configured to store second information received in a second WSI signal, and (c) a multiplexer. The multiplexer is configured to (i) receive the first information from the primary WDR, (ii) receive the second information from the shadow WDR, and (iii) output the first information or the second information based at least in part on a control signal input into the multiplexer.

Serial interfaces with shadow registers, and associated systems, devices, and methods

An example fuse error detection circuit configured to receive a first data set from a fuse array during a first fuse data broadcast and to encode the first data set to provide first signature data. The fuse error detection circuit is further configured to receive a second data set from the fuse array during a second fuse data broadcast and to encode the second data set to provide second signature data. The fuse error detection circuit is further configured to compare the first signature data and the second signature data and to provide a match indication having a value based on the comparison between the first signature data and the second signature data.

Apparatuses and methods for fuse error detection

Methods, systems, and devices related to identifying high impedance faults in a memory device are described. A memory device may perform a first write operation to write a first logic state to a memory cell. During the first write operation, the memory device may establish a connection between a supply line and a control line associated with applying an output of a driver of a digit line coupled to the memory cell. After performing the first operation, the memory device may configure the supply line in a floating state. After the supply line is floated, the memory device may perform a second write operation to write a second logic state to the memory cell. The memory device may perform a third operation for reading the memory cell. The memory device may determine the condition of the supply line or control based on the result of the read operation.

Identifying high impedance faults in a memory device

Methods, systems, and devices for memory device random option inversion are described. A memory device may use a second set of fuses to selectively invert options associated with a first set of fuses (e.g., blown fuses). The first set of fuses may output a first set of logic states. Option inversion logic circuitry may perform decoding based on a second set of logic states output by the second set of fuses to identify logic states of the second set of logic states that match the first set of logic states. Based on identifying the logic states, the option inversion logic circuitry may select either a logic state of the first set of logic states or an inverted logic state corresponding to the logic state, and store the selected logic state in a latch of the memory device.

Memory device random option inversion

Methods, systems, and devices for memory read masking are described. In some cases, a portion of a memory device, such as a portion of a memory array, may be disabled. During a testing operation, a command for accessing one or more memory cells of the disabled portion may be received, and the associated memory cells may be attempted to be accessed. Based on attempting to access the disabled memory cells, a logic state of the disabled cells may be masked. Outputting the masked value may indicate (e.g., to a testing device) that the disabled cells pass the test (e.g., that the memory cells are valid), which may allow for the enabled memory cells and the disabled memory cells of the memory device to be tested using a single test mode.

Memory read masking

Embodiments of the disclosure are drawn to apparatuses and methods for timing refresh operations in a memory device. An apparatus may include an oscillator that provides a periodic signal to one or more refresh timer circuits. Each of the refresh timer circuits is associated with a respective memory bank in the memory device. The refresh timer may include a counter block and a control logic block. The control logic block may gate the periodic signal to the counter block. The counter block may count the row active signal time and the row precharge time. The counter signals may be used by the control logic block to output a number of pumps of a refresh operation.

Apparatuses and methods for multi-bank refresh timing

The exercise and rehabilitation device of the present invention includes a telescopic tube, having a first tube with upper and lower ends, and a second tube, having upper and lower ends, telescopically received in the upper end of the first tube. The lower end of the first tube has a base plate secured thereto by a joint which may be flexible or rigid. An open hand support may be secured to the upper end of the second tube by a flexible joint. A closed hand support may be secured to the upper end of the second tube by a double-ball mounting assembly. A forearm support may be secured to the upper end of the second tube by the double-ball mounting assembly.

Exercise and rehabilitation device

The exercise device of the present invention includes an elongated rigid bar having a handle disposed at one end and a joint projection disposed at the opposite end. The joint projection is pivotably received by the joint collar of an exercise attachment. In an alternate embodiment, a second joint projection is provided at the opposite end of the exercise device to pivotably receive a second exercise attachment. The pivoting connection between the exercise attachments and the rod mimics normal biomechanical movement to decrease the chance of injury or re-injury to the user. The exercise device is telescopically extendable to selectively change its usable length.

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Boise, ID, United States of America

Daniel S Miller