Growing community of inventors

Los Angeles, CA, United States of America

Daniel R Gossett

Average Co-Inventor Count = 3.24

ph-index = 7

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 137

Daniel R GossettDino Di Carlo (17 patents)Daniel R GossettHenry T K Tse (15 patents)Daniel R GossettAram J Chung (7 patents)Daniel R GossettWestbrook Weaver (1 patent)Daniel R GossettHenry TK Tse (0 patent)Daniel R GossettDaniel R Gossett (17 patents)Dino Di CarloDino Di Carlo (53 patents)Henry T K TseHenry T K Tse (16 patents)Aram J ChungAram J Chung (9 patents)Westbrook WeaverWestbrook Weaver (7 patents)Henry TK TseHenry TK Tse (0 patent)
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Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. University of California (17 from 15,579 patents)


17 patents:

1. 12007321 - System and method for deforming and analyzing particles

2. 11169078 - Method and device for high throughput cell deformability measurements

3. 10967296 - Method and device for high-throughput solution exchange for cell and particle suspensions

4. 10969327 - System and method for deforming and analyzing particles

5. 10500526 - Method and device for high-throughput solution exchange for cell and particle suspensions

6. 10295455 - System and method for deforming and analyzing particles

7. 10226769 - Method and device for high-throughput solution exchange for cell and particle suspensions

8. 10107735 - System and method for deforming and analyzing particles

9. 9897532 - Method and device for high throughput cell deformability measurements

10. 9815060 - Method and device for high-throughput solution exchange for cell and particle suspensions

11. 9638620 - System for deforming and analyzing particles

12. 9522344 - Method and device for high-throughput solution exchange for cell and particle suspension

13. 9464977 - System and method for deforming, imaging and analyzing particles

14. 9222870 - Method and device for multi-parameter imaging within a single fluorescent channel

15. 9151705 - System and method for deforming and analyzing particles

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