International Business Machines Corporation

Globalfoundries Inc.

Daniel Peter Morris

Lawrence Shungwei Mok

Keith E Fogel

Paul Alfred Lauro

Brian Samuel Beaman

Da-Yuan Shih

Yun-Hsin Liao

Paul William Coteus

Gareth Geoffrey Hougham

Richard Alan Haight

Steven Alan Cordes

Alphonso Philip Lanzetta

Alfred Wagner

Sherif Ahmed Goma

Matthew J Farinelli

Joanna Rosner

Peter P Longo

Ali Afzali

Nisha Yohannan

Alfred Viehbeck

Martin J Goldberg

Fuad Elias Doany

Frank Robert Libsch

Timothy C Reiley

Shashi D Malaviya

Harry R Bickford

Jeonghwan Song

George Liang-Tai Chiu

Steven Allen Cordes

William L Boland

Da-Juan Shih

A laser apparatus for use in a surgical procedure is disclosed including a housing forming a part of a handpiece and including interior and exterior regions, a laser cavity extending within the interior region of the housing, at least a portion of an operating laser element positioned with the interior region of the housing for generating an operating beam, and a controller to control a focal position of the operating beam to a location above the plane of the tissue for ablation of the tissue by laser induced breakdown thereof.

Laser surgical apparatus and methods of its use minimizing damage during the ablation of tissue using a focused ultrashort pulsed laser beam wherein the slope of fluence breakdown is a function of the pulse width

A grating structure has a plurality of gratings. In one example, one or more of the gratings are configured: to be non-uniformly spaced with respect to one or more other ones of the gratings; and to optically couple a first light conduit and a second light conduit enabling light having a first polarization and light having a second polarization to pass through the grating structure and propagate in the same direction in the first light conduit or the second light conduit. The non-uniform spacing of the gratings may represent an intersection or a union of a period associated with the light having the first polarization and a period associated with the light having the second polarization.

Polarization-independent grating coupler for silicon on insulator

Coaxial probe structures include a plurality of discrete insulated elongated electrical conductors projecting from a support surface which are useful as probes for testing of electrical interconnections to electronic devices, such as integrated circuit devices and other electronic components and particularly for testing of integrated circuit devices with rigid interconnection pads and multi-chip module packages with high density interconnection pads. Coaxial probe structures are fabricated by the methods described providing a high density coaxial probe.

Coaxial probe structure of elongated electrical conductors projecting from  a support structure

Techniques for forming enhanced electrical connections are provided. In one aspect, a method of forming an electrical connecting device includes the steps of: depositing an elastomeric material on an electrically insulating carrier; and metallizing the elastomeric material so as to form an electrically conductive layer running continuously through a plane of the carrier and along a surface of the elastomeric material.

Method of forming metallized elastomeric electrical contacts

Structures having a plurality of discrete insulated elongated electrical conductors projecting from a support surface which are useful as probes for testing of electrical interconnections to electronic devices, such as integrated circuit devices and other electronic components and particularly for testing of integrated circuit devices with rigid interconnection pads and multi-chip module packages with high density interconnection pads and the apparatus for use thereof and to methods of fabrication thereof. Coaxial probe structures are fabricated by the methods described providing a high density coaxial probe.

Probe structure having a plurality of discrete insulated probe tips projecting from a support surface, apparatus for use thereof and methods of fabrication thereof

The present invention is directed to structures having a plurality of discrete insulated elongated electrical conductors projecting from a support surface which are useful as probes for testing of electrical interconnections to electronic devices, such as integrated circuit devices and other electronic components and particularly for testing of integrated circuit devices with rigid interconnection pads and multi-chip module packages with high density interconnection pads and the apparatus for use thereof and to methods of fabrication thereof. Coaxial probe structures are fabricated by the methods described providing a high density coaxial probe.

Redox method of forming a coaxial probe structure of elongated electrical conductors projecting from a support structure

Electrodeposition method of forming a probe structure having a plurality of discrete insulated probe tips projecting from a support surface

In one aspect the invention provides a method for laser induced breakdown of a material with a pulsed laser beam where the material is characterized by a relationship of fluence breakdown threshold (Fth) versus laser beam pulse width (T) that exhibits an abrupt, rapid, and distinct change or at least a clearly detectable and distinct change in slope at a predetermined laser pulse width value. The method comprises generating a beam of laser pulses in which each pulse has a pulse width equal to or less than the predetermined laser pulse width value. The beam is focused above the surface of a material where laser induced breakdown is desired. The region of least confusion (minimum beam waist or average spot size) is above the surface of the material in which laser induced breakdown is desired since the intensity of the beam falls off in the forward direction, preferably the region of the beam at or within the surface is between the region of least confusion and sufficient to remove material and the minimum intensity necessary for laser induced breakdown of the material to be removed, most preferably the region of minimum intensity is disposed at the surface of the material to be removed. The beam may be used in combination with a mask in the beam path. The beam or mask may be moved in the x, y, and Z directions to produce desired features. The technique can produce features smaller than the spot size and Rayleigh range due to enhanced damage threshold accuracy in the short pulse regime.

Method for minimizing sample damage during the ablation of a first biological material disposed on a second biological material using a focused ultrashort pulsed laser beam wherein the slope of fluence breakdown is a function of the pulse width

A probe structure for an electronic device is provided. In one aspect, the probe structure includes an electrically insulating carrier having one or more contact structures traversing a plane thereof. Each contact structure includes an elastomeric material having an electrically conductive layer running along at least one surface thereof continuously through the plane of the carrier. The probe structure includes one or more other contact structures adapted for connection to a test apparatus.

Metalized elastomeric probe structure

A portable computer adapted for electrical connection to a docking station having multiple power modes of operation is described. The portable computer has one or more CPU chips which have at least two power modes of operation, a low power mode and a high power mode. When the portable computer is operated as a stand-alone computer, it operates in the low power mode. When the portable computer is operated while electrically connected to the docking station, it operates in a high power mode. The docking station has greater cooling capacity than the portable computer alone to provide enhanced cooling of the high power mode of operation.

Method of fabricating a portable computer apparatus with thermal enhancements and multiple power modes of operation

Portable computer apparatus with thermal enhancements and multiple modes of operation

Method of operation of a portable computer apparatus with thermal enhancements and multiple modes of operation

Techniques for forming enhanced electrical connections are provided. In one aspect, an electrical connecting device comprises an electrically insulating carrier having one or more contact structures traversing a plane thereof. Each contact structure comprises an elastomeric material having an electrically conductive layer running along at least one surface thereof continuously through the plane of the carrier.

Metalized elastomeric electrical contacts

Method of fabrication of a portable computer apparatus with thermal enhancements and multiple modes of operation

Growing community of inventors

Purchase, NY, United States of America

Daniel Peter Morris