Ams Sensors Singapore Pte. Ltd.

Heptagon Micro Optics Pte. Ltd.

Daniel Pérez Calero

Bassam Hallal

Markus Rossi

Moshe Doron

Hartmut Rudmann

Bernhard Buettgen

Michael Lehmann

Miguel Bruno Vaello Paños

Stephan Beer

Matthias Gloor

Tobias Senn

Alireza Yasan

Jens Kubacki

Jim Lewis

Jens Geiger

Dmitry Vasily Bakin

Peter Roentgen

Mario Cesana

Jukka Alasirnio

Ohad Meitav

Florin Cutu

Martin Lukas Balimann

Peter Riel

Julien Boucart

Philippe Bouchilloux

Hendrik Volkerink

Mai-Lan Elodie Boytard

Kai Engelhardt

Hans Peter Herzig

Ali Naqavi

Philipp Mueller

Daniel Infante Gomez

Sophie Godé

Image sensor modules include primary high-resolution imagers and secondary imagers. For example, an image sensor module may include a semiconductor chip including photosensitive regions defining, respectively, a primary camera and a secondary camera. The image sensor module may include an optical assembly that does not substantially obstruct the field-of-view of the secondary camera. Some modules include multiple secondary cameras that have a field-of-view at least as large as the field-of-view of the primary camera. Various features are described to facilitate acquisition of signals that can be used to calculate depth information.

Image sensor modules including primary high-resolution imagers and secondary imagers

An optoelectronic module including a light emitter to generate light to be emitted from the module; a plurality of spatially distributed light sensitive elements arranged to detect light from the emitter that is reflected by an object outside the module; and one or more dedicated spurious-reflection detection pixels.

Optoelectronic modules operable to recognize spurious reflections and to compensate for errors caused by spurious reflections

An optoelectronic module including a light emitter to generate light to be emitted from the module, a plurality of spatially distributed light sensitive elements arranged to detect light from the emitter that is reflected by an object outside the module, and one or more dedicated spurious-reflection detection pixels.

The illumination module for emitting light () can operate in at least two different modes, wherein in each of the modes, the emitted light () has a different light distribution. The module has a mode selector () for selecting the mode in which the module operates, and it has an optical arrangement. The arrangement includes&#x2014;a microlens array (LL) with a multitude of transmissive or reflective microlenses () which are regularly arranged at a lens pitch P (P);&#x2014;an illuminating unit for illuminating the microlens array (LL). The illuminating unit includes a first array of light sources (S) operable to emit light of a first wavelength Leach and having an aperture each. The apertures are located in a common emission plane which is located at a distance D (D) from the microlens array (LL). In a first one of the modes, for the lens pitch P, the distance D and the wavelength Lapplies P=2&#xb7;L&#xb7;D/N wherein N is an integer with N&#x2265;1.

Multi-mode illumination module and related method

Optoelectronic modules () are operable to distinguish between signals indicative of reflections from an object of interest and signals indicative of a spurious reflection. Various modules are operable to recognize spurious reflections by means of dedicated spurious-reflection detection pixels () and, in some cases, also to compensate for errors caused by spurious reflections.

This disclosure describes various modules that can provide ultra-precise and stable packaging for an optoelectronic device such as a light emitter or light detector. The modules include vertical alignment features that can be machined, as needed, during fabrication of the modules, to establish a precise distance between the optoelectronic device and an optical element or optical assembly disposed over the optoelectronic device.

Light emitter and light detector modules including vertical alignment features

An apparatus for producing structured light comprises a first optical arrangement which comprises a microlens array (L) comprising a multitude of transmissive or reflective microlenses () which are regularly arranged at a lens pitch P and an illumination unit for illuminating the microlens array. The illumination unit comprises an array (S) of light sources () for emitting light of a wavelength L each and having an aperture each, wherein the apertures are located in a common emission plane which is located at a distance D from the microlens array. For the lens pitch P, the distance D and the wavelength L, the following equation applies P=2LD/N, wherein N is an integer with N&#x2265;1. High-contrast high-intensity light patterns can be produced. Devices comprising such apparatuses can be used for depth mapping.

Apparatus for producing patterned illumination using arrays of light sources and lenses

The present disclosure describes optoelectronic modules (e.g., hybrid lens array packages) that have multiple optical channels, each of which includes at least one beam shaping element (e.g., a lens) that is part of a laterally contiguous array. Each optical channel is associated with a respective light sensitive region of an image sensor. Some or all of the channels also can include at least one beam shaping element (e.g., a lens) that is not part of a laterally contiguous array. In some cases, the arrays can include alignment features to facilitate alignment of the arrays with one another.

Optoelectronic modules including hybrid arrangements of beam shaping elements, and imaging devices incorporating the same

The present disclosure describes optical imaging and optical detection modules that include sensors such as time-of-flight (TOF) sensors. Various implementations are described that, in some instances, can help reduce the amount of optical cross-talk between active detection pixels and reference pixels and/or can facilitate the ability of the sensor to determine an accurate phase difference to be used, for example, in distance calculations.

Optical imaging modules and optical detection modules including a time-of-flight sensor

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Zurich, Switzerland

Daniel Pérez Calero