Acculogic Corporation

Daniel Marques

Karim Dehkordi

Before technical components are further processed, they are checked for the functionality thereof. In this case, an incorrect judgment of the functionality can occur due to measurement errors or incorrect measurements, which in turn results in a very inefficient test. The invention provides a method and a device by which an increased measurement accuracy can be achieved. This is achieved in that at least one first electrical voltage value is measured at a first constant measurement current and at least one second electrical voltage value is measured at a second constant measurement current at terminals of the component. Every measured voltage value is scaled respectively using a profile factor PF to form a measured value M, and only measured values M that are located at least with a tolerance range in a common value range are used for the determination of an electrical parameter.

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Markham, Canada

Daniel Marques