Arm Limited

Sunrise Micro Devices, Inc.

Daniel Lewis Cross

Edgar Herbert Callaway, Jr

Vasan Venkataraman

Brian Alan Nagel

A method, apparatus and system are provided for the tuning of embedded subsystems of a device under test (DUT) that have analog characteristics. In response to a tester invoking one or more test procedures via a command channel between the tester and a target embedded subsystem of the DUT, test firmware of the invoked tests is loaded into the target embedded subsystem. The target embedded subsystem executes the tests under control of the tester in accordance with test parameters received from the tester over the command channel and in accordance with test commands received from the tester over a test signaling channel. The target embedded subsystem returns results of the one or more tests to the tester via the command channel. The results can be used to trim analog characteristics of the target embedded subsystem and can be stored in memory. The test firmware can then be deleted to free up memory space.

Method, system and apparatus for tuning an integrated embedded subsystem

A method, apparatus, and device provide for the detection of the adequacy of the current sourcing capability of a power source. The current sourcing capability of the power source is dynamically detected by sampling comparison values obtained during one or more sampling sub-windows and determining a sample density of comparison values. In response to the sample density of comparison values crossing a selectable density threshold, an insufficient-supply indication is generated.

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Boca Raton, FL, United States of America

Daniel Lewis Cross