Anton Paar Gmbh

Research Center for Non Destructive Testing Gmbh

Research Center Pharmaceutical Engineering Gmbh

Daniel Koller

Alberto Gomez-Casado

Markus Brandner

Norbert Pinno-Rath

Johannes Khinast

Michael Leitner

Daniel Markl

Gernot Leuprecht

Guenther Hannesschlaeger

Stephan Sacher

Martin Godec-Schönbacher

Günther Hannesschläger

A handling apparatus for handling a measuring probe of a scanning probe microscope is disclosed. The measuring probe has a probe body and a probe tip which is coupled with the probe body by a cantilever. The handling apparatus includes a receiving device for receiving the measuring probe at a receiving area, a guide structure, in which the measuring probe is guidable while at the same time the probe body is at least partially limited and the cantilever and the probe tip are supported without contact, and a transport device for transporting the measuring probe from the receiving area along the guide structure to a target area.

Handling device for handling a measuring probe

A scanning probe microscope analyses a sample by moving a probe and the sample relative to one another. The scanning probe microscope includes a detection unit for detecting an image of a gap between the sample and the probe in a substantially horizontal side view.

Imaging a gap between sample and probe of a scanning probe microscope in a substantially horizontal side view

A scanning probe microscope, in particular an atomic force microscope, for analyzing a sample by moving a probe and the sample relative to one another, wherein the scanning probe microscope includes a detection unit with a side view camera arranged and configured for detecting an image of the sample in a substantially horizontal side view, and a determining unit for determining information indicative of a profile of at least part of a surface of the sample based on the detected image.

Characterizing a height profile of a sample by side view imaging

A holding device for detachably holding a magnetic sample holder or a sample body, in particular for a scanning probe microscope, wherein the holding device includes an accommodation unit for accommodating the magnetic sample holder or the sample body, a magnetic field guiding unit which, in a holding mode, is adapted for guiding a magnetic field for applying a magnetic holding force at the accommodation unit for holding the magnetic sample holder or sample body which is accommodated at the accommodation unit, and a magnetic field switching unit which is adapted for switching between at least two relative arrangements between the magnetic field guiding unit and the magnetic field switching unit, in order to selectively adjust the holding mode or a release mode, wherein in the release mode the magnetic sample holder or sample body is released for being detached from the accommodation unit.

Definably switchable magnetic holding device

A method and a device for monitoring a property of a coating of a solid dosage form during a coating process forming the coating of the solid dosage form are provided. The device comprises a coating apparatus configured for forming the coating on the solid dosage form, and a monitoring apparatus configured for monitoring the property of the coating of the solid dosage form in process, wherein at least a part of the monitoring apparatus is located so as to have insight in an interior of the coating apparatus, the interior accommodating the solid dosage form to be coated and a precursor for forming the coating, and wherein the monitoring apparatus is configured for monitoring the property of the coating of the solid dosage form simultaneously with and during a coating process using low coherence interferometry.

Device and method for monitoring a property of a coating of a solid dosage form during a coating of the solid dosage form

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Graz, Austria

Daniel Koller