International Business Machines Corporation

Daniel Kiss

Alejandro Alberto Cook Lobo

Christian Jacobi

Alper Buyuktosunoglu

Phillip John Restle

Tobias Webel

Andrew A Turner

Eberhard Engler

Sean Michael Carey

Edward C McCain

Kennedy K Cheruiyot

Pradeep Bhadravati Parashurama

Kevin P Low

Karl Evan Smock Anderson

Isidore G Bendrihem

Ian Krispin Carmichael

Gregory Scott Still

Andreas H A Arp

Eric Jason Fluhr

Thomas Gentner

Jens Kuenzer

Hagen Schmidt

Embodiments include in response to monitoring a processor during operation, detecting a first number of throttling amounts in the processor, determining that the first number of throttling amounts fulfills a first condition regarding a throttling amounts threshold, and modifying a voltage level of the processor by a first amount. Embodiments include in response to modifying the voltage level of the processor by the first amount, detecting a second number of throttling amounts in the processor, determining that the second number of throttling amounts fulfills a second condition regarding the throttling amounts threshold, and modifying the voltage level of the processor by a second amount.

Dynamic guard band with timing protection and with performance protection

Embodiments include in response to monitoring a processor during operation, detecting a first number of core recovery events in the processor, determining that the first number of core recovery events fulfills a first condition for the first core recovery events threshold, and modifying a value of at least one droop sensor parameter of the processor by a first amount. The at least one droop sensor parameters affects a sensitivity to a voltage droop. In response to modifying the value of the droop sensor parameter by the first amount, a second number of core recovery events is detected in the processor. It is determined that the second number of core recovery events fulfills a second condition for a second core recovery events threshold, and the value of the at least one droop sensor parameter is modified by a second amount.

Clocks of two semiconductor circuit are set to a common clock source when both the first and second semiconductor circuits are in a slow clock speed at which an input/output (IO) at an interface between the first and second semiconductor circuit is capable of operating. Division counters of the two clocks are synchronized at the slow clock speed. The two semiconductor circuits are switched to a fast clock speed that is a multiple of the slow speed, wherein the IO is not capable of operating at the fast clock speed. Pulses from a division counter of the first circuit are sent to a spare division counter of the second circuit, and then a primary division counter of the second counter is aligned to this spare division counter to keep the two circuits synchronized at the fast clock speed.

Dual chip clock synchronization

Embodiments of the invention are directed to a built-in self-test system for an electronic circuit. The system includes a memory having two or more base seeds stored thereon. The system further includes seed generation logic configured to generate, based at least in part on the two or more base seeds, a plurality of generated seeds. The generated seeds can be constructed from the base seeds such that each of the generated seeds encodes a test pattern that satisfies a functional constraint. A finite state machine is configured to generate, based on the plurality of generated seeds, a sequence of constrained pseudorandom test patterns. A test controller is operable to place the electronic circuit into a test mode based on the constrained pseudorandom test pattern.

Constrained pseudorandom test pattern for in-system logic built-in self-test

Growing community of inventors

Stuttgart, Germany

Daniel Kiss