Tektronix, Inc.

Lawrence Livermore National Security, LLC

Triquint Semiconductor Corporation

Tektronic, Inc.

Daniel G Knierim

Barton T Hickman

Ira G Pollock

Josiah A Bartlett

Patrick A Smith

Joshua J O'Brien

Lester L Larson

Michael Duane Stevens

Kenneth P Dobyns

Julie A Campbell

William A Hagerup

David L Kelly

Scott R Jansen

Dan H Wolaver

Jonathan S Dandy

John F Stoops

David Lyell Knierim

John J Pickerd

Eric P Etheridge

Que Thuy Tran

Gregory A Martin

David Everett Burgess

Michael J Wadzita

Gordon W Shank

John C Calvin

Shane A Hazzard

James S Lamb

Tyler B Niles

Steven K Sullivan

Richard A Booman

Martin Spence Denham

Michael J Mende

Arthur J Metz

Patrick Satarzadeh

Frederick George Weiss

James D Pileggi

Theodore G Nelson

Karl A Rinder

Charles W Case

Donald J Dalebroux

Karen Hovakimyan

Brandon Walter Buckley

Ryan Douglas Muir

Jeffrey A Kleck

Jed H Andrews

Richard J Huard

Kevin E Cosgrove

Alexander Krauska

George S Walker

Kayla R Klingman

Michael P Khaw

Lee J Jalovec

Keith H Lofstrom

Michael A Martin

Amr Haj-Omar

Martin Rockwell

Andrew W Rusinek

David Thomas Engquist

Bart A Mooyman-Beck

Robert J Woolhiser

John C Delacy

Christopher R Muggli

John A Martin

Scott L Williams

Ronald A Olisar

Arif Kareem

Christopher Muggli

David Kelly

Michael Martin

An apparatus includes a fixed substrate having at least two contact structures, a movable substrate having at least two electrically conductive paths, a housing containing the fixed substrate and the movable substrate, a plurality of connectors in the housing, each connector connecting to one of the at least two contact structures to connect to ground and a spring contact, the plurality of connectors arranged to connect to at least one of the conductive paths depending upon a position of the movable substrate, and a motorized stage in the housing to move the movable substrate to align one of the at least two conductive paths to form a connection between two of the connectors. The apparatus may be part of a test and measurement instrument, and a method of operating the apparatus is also included.

Precision, high bandwidth, switching attenuator

A current measurement device includes a shunt having sense leads, the shunt configured to be located in a current path for a current to be measured, and a Rogowski coil at least partially wrapped around the shunt, the current measuring device configured to combine signals from the shunt and the Rogowski coil. A current measurement device includes a shunt having sense leads configured to be located in a current path for a current to be measured, a Rogowski coil in series with the sense leads and at least partially wrapped around the shunt, a compensating pole connected to the Rogowski coil, and an isolation barrier connected to the compensating pole.

Current monitor combining a shunt resistor with a Rogowski coil

A probe tip for an isolated probe having a triaxial cable has a conductive probe tip interface at one end of the cable, a signal conductor, the signal conductor traversing a length of the cable and electrically connected to the conductive probe tip interface, a reference conductor surrounding the signal conductor along the length of the cable, a shield conductor surrounding the reference conductor at least along the length of the cable, the shield conductor and the reference conductor electrically connected at ends of the probe tip, a first insulator between the signal conductor and the reference conductor along the length of the cable, a second insulator between the reference conductor and the shield conductor along the length of the cable, and high magnetic permeability material inside the shield conductor. A method of manufacturing a tip for an isolated probe having a triaxial cable includes accessing a shield conductor of the triaxial cable, inserting a high magnetic permeability material between the shield conductor and a reference conductor in the triaxial cable, electrically connecting the shield conductor to the reference conductor. A triaxial cable has a signal conductor, the signal conductor traversing a length of the cable, a reference conductor surrounding the signal conductor along the length of the cable, a shield conductor surrounding the reference conductor along the length of the cable, the shield conductor and the reference conductor electrically connected at ends of the cable, a first insulator between the signal conductor and the reference conductor along the length of the cable, a second insulator between the reference conductor and the shield conductor along the length of the cable, and high magnetic permeability material inside the shield conductor.

Isolated probe tip

Disclosed is a signal isolating test instrument, such as an electronics test probe. The instrument includes an input to receive a floating analog signal. An upconverter is employed to modulate the floating analog signal to a microwave frequency analog signal. An isolation barrier prevents coupling of the floating analog signal to an earth ground. The instrument employs a microwave structure to transmit the microwave frequency analog signal across the isolation barrier via electromagnetic coupling. A downconverter is then employed to demodulate the microwave frequency analog signal to obtain a ground referenced test signal corresponding to the floating analog signal.

Analog signal isolator

An isolated differential current shunt measurement probe for a test and measurement system having an isolation barrier between an input side and output side of the probe. The input side is configured to receive a voltage signal across a current shunt connected to a device under test and transmit the voltage signal across the isolation barrier. The output side is configured to receive the voltage signal across the isolation barrier and output the voltage signal to a test and measurement instrument.

Current shunt probe

A new test system includes a programmed device having an input port for receiving a signal for testing or measuring on the programmed device, and a reprogrammable test accessory having an output coupled to the input port of the programmed device. The reprogrammable test accessory further includes a test port structured to accept one or more test signals from a Device Under Test (DUT), and a reprogrammable processor. The reprogrammable processor may further include reprogrammable standards and protocols, reprogrammable triggers and margin detection, reprogrammable link training, reprogrammable handshaking, and reprogrammable setup and control facilities for either or both of the DUT and the programmed device.

Test and measurement instrument accessory with reconfigurable processing component

An apparatus has at least substrate having at least two conductive paths, a least two connectors positioned in a first plane, and a movable stage connected to one of the at least one substrate to move the one substrate perpendicular to the first plane form an electrically conductive path between two of the at least two connectors.

Disclosed is a signal isolating test instrument, such as an electronics test probe. The instrument includes an input to receive a floating analog signal. An upconverter is employed to modulate the floating analog signal to a microwave frequency analog signal. An isolation barrier in the instrument prevents coupling of the floating analog signal to an earth ground. The instrument employs a microwave structure to transmit the microwave frequency analog signal across the isolation barrier via electromagnetic coupling. A downconverter is then employed to demodulate the microwave frequency analog signal to obtain a ground referenced test signal corresponding to the floating analog signal.

Methods and devices for digitizing an analog repetitive signal using waveform averaging are described. An example method includes generating a discrete set of analog dither offset voltages, wherein at least two of the discrete set of analog dither offset voltages are different from each other, receiving the analog repetitive signal comprising multiple instances of a waveform, wherein the waveform has a waveform duration, generate a timing alignment to align each waveform of the analog repetitive signal and the corresponding analog dither offset voltage over the waveform duration, combining, based on the timing alignment, each waveform and the corresponding analog dither offset voltage over the waveform duration to produce an analog output signal, converting the analog output signal to a digital output signal, and producing, based on the timing alignment, a digital averaged signal based on averaging the multiple instances of the waveform in the analog output signal.

Discrete offset dithered waveform averaging for high-fidelity digitization of repetitive signals

A test and measurement system can include a data store configured to store augmentation settings for dynamically augmenting a physical testing environment and a computing device coupled to the data store. The computing device can be configured to receive an input feed from the physical testing environment, create an augmentation image based on the augmentation settings and the input feed, and output the augmented image to be overlaid on the physical testing environment to augment a user's view of the physical testing environment.

Test and measurement devices, systems and methods associated with augmented reality

A test and measurement instrument for measuring a current in a device under test, comprising an input configured to receive signals from a magnetic field probe; and one or more processors configured to measure, from a signal from the magnetic field probe, a magnetic field generated by a current-carrying conductor of the device under test based on a known current, determine a calibration factor based on the known current and the magnetic field, and generate a calibrated measurement of an unknown current in the current-carrying conductor using a magnetic field generated by the current-carrying conductor based on the unknown current and the calibration factor.

Calibration of magnetic field sensor for current probe

An accessory device has a test port, an instrument port to connect to an instrument having an operating bandwidth, and one or more configurable signal paths connectable between the test port and the instrument port to convert a signal from the test port having a first frequency range to a signal having a second frequency range different than the first frequency range. A test and measurement system has a test and measurement instrument having an operating bandwidth, and an accessory device. The accessory device has a first instrument port to connect the accessory device to the test and measurement instrument, a test port to connect the accessory device to a device under test, and one or more configurable signal paths connectable between the test port and the instrument port to down-convert a signal from the test port having a first frequency range to a signal having a second frequency range lower than the first frequency range.

Frequency converter accessory for a test and measurement instrument

Methods of triggering a test and measurement instrument having a plurality of inputs include the step of generating a trigger signal in response to every occurrence of any one of a plurality of specified trigger events. A first specified trigger event occurs in at least a first one of the inputs and a second specified trigger event occurs in at least a second one of the plurality of inputs. A specified trigger event may include at least one selected input from the plurality of inputs and a selected activity type. Some methods include configuring each of a plurality of event activity detectors to produce a pulse in a logic signal in response to every occurrence of one of the specified trigger events. The plurality of logic signals are combined in a logical OR circuit to generate the trigger signal. Trigger circuits configured according to these methods are also disclosed.

Event activity trigger

A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.

Automatic probe ground connection checking techniques

A system includes a plurality of oscilloscopes, each oscilloscope having an output port and an input port, a cable connecting the output port of an initial oscilloscope of the plurality of oscilloscopes to the input port of a second oscilloscope of the plurality of oscilloscopes, the initial oscilloscope having a processing element to generate a master run clock, the second oscilloscope having a processing element including a phase-locked loop to lock a slave run clock to the master run clock, wherein the processing element of one of the oscilloscopes executes code to cause the processing element to manipulate one of the run clocks to pass trigger information to another of the plurality of oscilloscopes. A method of synchronizing at least two oscilloscopes including a master oscilloscope and at least one slave oscilloscope includes connecting the at least two oscilloscopes together using output ports and input ports of the at least two oscilloscopes and at least one cable; sending a master run clock from the master oscilloscope to at least one slave oscilloscope; synchronizing a run clock of the at least one slave oscilloscope to the master run clock; recognizing a trigger event at a first oscilloscope of the at least two oscilloscopes; altering the run clock at the first oscilloscope to encode a trigger indication; and receiving the altered run clock at a second oscilloscope of the at least two oscilloscopes, wherein the trigger indication causes the second oscilloscope to recognize the trigger event.

Systems and methods for synchronizing multiple test and measurement instruments

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Beaverton, OR, United States of America

Daniel G Knierim