Howard Hughes Medical Institute

Daniel Flickinger

Karel Svoboda

Kaspar Podgorski

Nicholas Sofroniew

Abbas Kazemipour

A method of imaging a sample providing light from a light source, directing the provided light into an extended focus, scanning the extended focus across a wavefront modulating element that modulates amplitudes of the light along the extended focus, providing the modulated light to the sample, detecting light emitted from the sample in response to excitation by the modulated light, and generating an image of the sample based on the detected fluorescence emission light.

Random access projection microscopy

A microscope system including: a source of light; a sample objective configured for focusing the light at a focal plane within a sample; a remote focus unit configured for changing a position of the focal plane along an axis perpendicular to the focal plane; one or more optical element configured for directing the focused light to a location within the focal plane; and a detector configured for detecting light emitted from the focal plane within the sample; wherein the one or more optical element is located after the remote focus unit along a beam path of the light from the source to the sample objective, such that the changing the position of the focal plane along the axis is performed before the directing the focused light to the location within the focal plane.

Large field of view, high resolution microscope

Techniques are described for imaging a sample where the techniques include acquiring a raster scan image of the sample, providing light from a light source, directing the light into a plurality of different light beam paths at different times, providing light in each of the plurality of light beam paths through an objective lens to the sample, and providing light in each of the plurality of beams to different locations within the sample. Fluorescence emission light from the sample is detected in response to excitation by light in each of the plurality of light beam paths, where the detected fluorescence emission light corresponds to fluorescence intensity projections of the sample with low mutual coherence, and an image of the sample is generated based on the detected fluorescence emission light and based on the raster scan image.

Growing community of inventors

Frederick, MD, United States of America

Daniel Flickinger