Micron Technology Incorporated

Other

Daniel Cram

A Jay Stutzman

Steven L Hamren

David J Corisis

Leland R Nevill

Tracy V Reynolds

Michael R Slaughter

Jerrold L King

Hani S Attalla

Scott Hoagland

Warren M Farnworth

Salman Akram

Kyle K Kirby

Roy T Lange

Amos J Stutzman

Methods, systems, and devices for thermal conduction based batch testing system are described. A testing system may include a set of memory devices may arranged on a loading cartridge and placed within the testing system. The testing system may include one or more test boards located in parallel with the memory devices within the testing system. In some cases, the testing system may push the test boards toward the cartridge, causing the memory devices to thermally couple with a heater board. The testing system may include a fluid filled cooling plate thermally coupled with the heater board. In some examples, the testing system may generate a vacuum within a housing containing the test boards and cartridge, which may cause the outside atmosphere to apply a force on the test boards towards the heater board.

Thermal conduction based batch testing system

Embodiments of interfaces are disclosed. One such interface has a plurality of connector assemblies, each connector assembly in a single opening of a plurality of openings passing completely through the interface. Each connector assembly has first and second connectors that are electrically and physically coupled to each other.

Interfaces having a plurality of connector assemblies

The present disclosure includes various method, device, and system embodiments for isolation circuits. One such isolation circuit embodiment includes: a first transistor configured for connection to a supply voltage via a first terminal; a register connected to the first transistor; a second transistor in parallel with a resistor, wherein the second transistor is configured for connection to the first terminal, with a gate of the second transistor configured for connection to an output of the register; and wherein the second transistor is configured for connection to a second terminal, the second transistor having a state that depends on a status of the register.

Isolation circuit

The invention includes methods of utilizing removable mechanical precising mechanisms and/or optical-based precising mechanisms to align chips within sockets. The sockets can be configured so that compression of the sockets opens a clamping mechanism. A chip can be placed within a socket with a manipulator and aligned during compression of the socket. Subsequently, the compression of the socket can be released while the manipulator remains in contact with the chip to hold the chip in place until the clamping mechanism is retaining the chip in the socket. The chip can then be released from the manipulator. The invention also includes systems for utilizing removable nests to align various chip geometries within generic socket designs.

Methods of providing semiconductor components within sockets

Microelectronic devices, methods for testing microelectronic devices, and detachable electrical components. One embodiment of an apparatus for testing microelectronic devices in accordance with the invention comprises a board having a primary side, a secondary side, a plurality of test sites at the primary side, and electrical lines electrically coupled to the test sites. The testing apparatus can further include a plurality of lead holes in the board. Individual lead holes have a sidewall and a conductive section plated onto the sidewall. In several embodiments, individual pairs of first and second lead holes are electrically coupled to electrical lines corresponding to an associated test site. The apparatus can further include a plurality of permanent fuses fixed to the board. Individual permanent fuses are electrically coupled to electrical lines associated with an individual test site and an individual pair of first and second lead holes. The testing apparatus can further include a replacement fuse mounted to an individual pair of first and second lead holes at a test site having a blown permanent fuse. The replacement fuse has a first lead with a press-fit member engaged directly with the plated section in the first lead hole. The replacement fuse further includes a second lead engaged with the second lead hole and a fuse element connected in series with the first and second leads.

Apparatus and methods for testing microelectronic devices

Methods and devices for placing a semiconductor wafer or other substrate in contact with solder are described. A wave soldering apparatus includes a solder bath, a nozzle for producing a solder wave, and a jig for orienting a substrate in a substantially vertical orientation and placing the substrate in contact with a cascading solder wave. In another wave soldering apparatus, a jig orients a semiconductor wafer in a substantially horizontal orientation in contact with the solder wave. Another soldering apparatus includes a tank comprising molten solder and a fixture configured to orient one or more semiconductor wafers in a substantially vertical orientation. Methods of placing semiconductor wafers or other substrates in contact with solder using the devices of the present invention are also disclosed.

Methods for placing substrates in contact with molten solder

An apparatus for forming a temporary electrical connection with a microelectronic component and associated systems and methods are disclosed herein. Embodiments of the apparatus can include a base, a plurality of electrical contacts coupled to the base, and a nest attached to the base. The nest includes a plurality of contact compartments aligned with peripheral leads of the microelectronic component and at least partially covering the contacts. Individual contact compartments are masked to prevent a corresponding contact from electrically contacting the peripheral leads of the microelectronic component. In one embodiment, the masked contact compartments are used as a guide zone to guide individual peripheral leads when the microelectronic component is seated at or unseated from the support surface. In an additional or alternative embodiment, the masked contact compartments are used to selectively isolate contacts, for example, from supply or ground electrical potentials.

Electrical testing apparatus having masked sockets and associated systems and methods

Systems and methods for testing packaged microelectronic devices are disclosed herein. One such system for testing a packaged microelectronic device includes a test socket configured to receive the device for testing and a tester interface including a plurality of test contacts aligned with external contacts of the device when the device is received within the test socket. The system further includes a mask proximate to the test socket and the test contacts. The mask includes a plurality of apertures arranged in a pattern corresponding to the plurality of test contacts and corresponding at least in part to the array of external contacts when the device is received within the test socket. The apertures include (a) first apertures sized to allow the corresponding test contacts to extend completely through the mask, and (b) one or more second apertures sized to allow the corresponding test contacts to extend only partially through the mask.

Systems and methods for testing packaged microelectronic devices

Methods of retaining semiconductor component configurations within sockets

Carriers comprising a carrier body having a plurality of openings holding a plurality of resilient contact probes are disclosed. A number of different embodiments for the resilient contact probes is also disclosed. The carriers of the present invention may be secured to an interface board (i.e., a printed circuit board (PCB)) and assembled with a substrate (e.g., a wafer having integrated circuitry thereon, a PCB, etc.). The resilient contact probes electrically contact the terminal pads of the interface board and the electrical contacts of the substrate to enable electrical testing of the substrate. The configuration of the resilient contact probes, in combination with the carrier body, enables preferential, high mechanical loading of the terminal pads with controlled, predictable loading of the electrical contacts. Methods of making and use are also disclosed, as are a plurality of embodiments of resilient contact probes.

Resilient contact probes

The present disclosure includes various method, device, and system embodiments for isolation circuits. One such isolation circuit embodiment includes: a first transistor having its source connected to a first terminal, wherein the first terminal connects a supply voltage to the source of the first transistor; a register connected to the drain of the first transistor; and a second transistor in parallel with a resistor, the gate of the second transistor is connected to an output of the register and a source of the second transistor is connected to the first terminal. In various embodiments, the drain of the second transistor is connected to a second terminal and the state of the second transistor depends on whether the register is loaded.

Systems configured for utilizing semiconductor components

Improved methods and apparatus are provided for the handling and testing of semiconductor devices. One embodiment comprises a die carrier for one or more semiconductor dice having very fine pitch electrical I/O (input/output) elements. The semiconductor dice are temporarily attached to the die carrier in singulated form to enable testing the dice with conventional contact technology. The die carrier may include a flex circuit base substrate and a rigid support frame. Further embodiments comprise materials and methods for attaching the semiconductor dice to the die carrier and for providing a temporary electrical connection with the semiconductor dice during testing. Exemplary materials for providing the temporary electrical connection may comprise a conductive film or tape, a conductive or conductor-filled epoxy, resin or RTV adhesive-based materials, a water-soluble material impregnated with a conductive filler or non-reflowed solder paste.

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Boise, ID, United States of America

Daniel Cram