Apple Inc.

P.a. Semi, Inc.

Daniel C Murray

Vincent R Von Kaenel

Brian J Campbell

Gregory Stuart Scott

Sribalan Santhanam

Jong-Suk Lee

John H Mylius

Conrad Havluj Ziesler

Rohit Kumar

Wei-Han Lien

Peter J Bannon

Andrew J Beaumont-Smith

Tse-Yu Yeh

Pradeep Kanapathipillai

Po-Yung Chang

Honkai Tam

Anup S Mehta

Shingo Suzuki

Toshinari Takayanagi

Jung Wook Cho

Junji Sugisawa

Dominic Go

Toshi Takayanagi

Michael Howard

Mark T Kuo

An integrated circuit may include multiple instances of a component (e.g. a processor) and a control circuit. The instances may be configured to operate in various modes. Some of the modes are incapable of presenting a worst-case load on the power supply. The control circuit may be configured to monitor the instances and detect the modes in which the instances are operating. Based on the monitoring, the control circuit may request to recover a portion of the voltage margin established for worst-case conditions in the instances.

Dynamic voltage margin recovery

An integrated circuit may include multiple instances of a component (e.g. a processor) and a control circuit. The instances may be configured to operate in various modes. Some of the modes are incapable of presenting a worst-case load on the power supply. The control circuit may be configured to monitor the instances and detect the modes in which the instances are operating. Based on the monitoring, the control circuit may request to recover a portion of the voltage margin established for worst-case conditions in the instances. If the instances are to change modes, they may be configured to request mode change from the control circuit. If the mode change causes an increase in the current supply voltage magnitude (e.g., to restore some of the recovered voltage margin), the control circuit may cause the restore and permit it to complete prior to granting the mode change.

An integrated circuit includes multiple instances of a component (e.g. a processor) and a control circuit. The instances may be configured to operate in various modes. Some of the modes are incapable of presenting a worst-case load on the power supply. The control circuit may be configured to monitor the instances and detect the modes in which the instances are operating. Based on the monitoring, the control circuit may request to recover a portion of the voltage margin established for worst-case conditions in the instances. If the instances are to change modes, they may be configured to request mode change from the control circuit. If the mode change causes an increase in the current supply voltage magnitude (e.g. to restore some of the recovered voltage margin), the control circuit may cause the restore and permit it to complete prior to granting the mode change.

In an embodiment, a system may include multiple processors and an automatic power state controller (APSC) configured to switch the processors between various operating points. The operating points may be described by data programmed into the APSC, and the APSC may include a register that is programmable with a target operating point request identifying a target operating point for the processors from among the described operating points. The data describing the operating points may also include an indication of whether or not the number of processors that may be concurrently active at the operating point is limited. Based on the indication and the number of active processors, the APSC may override the requested operating point with a reduced operating point. In some embodiments, a digital power estimator (DPE) may monitor operation of the processors and may throttle the processors when high power consumption is detected.

Dynamic voltage and frequency management based on active processors

In an embodiment, an integrated circuit includes multiple instances of a component (e.g. a processor) and a control circuit. The instances may be configured to operate in various modes. Some of the modes are incapable of presenting a worst-case load on the power supply. The control circuit may be configured to monitor the instances and detect the modes in which the instances are operating. Based on the monitoring, the control circuit may request to recover a portion of the voltage margin established for worst-case conditions in the instances. If the instances are to change modes, they may be configured to request mode change from the control circuit. If the mode change causes an increase in the current supply voltage magnitude (e.g. to restore some of the recovered voltage margin), the control circuit may cause the restore and permit it to complete prior to granting the mode change.

In one embodiment, an integrated circuit includes at least one logic circuit supplied by a first supply voltage and at least one memory circuit coupled to the logic circuit and supplied by a second supply voltage. The memory circuit is configured to be read and written responsive to the logic circuit even if the first supply voltage is less than the second supply voltage during use. In another embodiment, a method includes a logic circuit reading a memory cell, the logic circuit supplied by a first supply voltage; and the memory cell responding to the read using signals that are referenced to the first supply voltage, wherein the memory cell is supplied with a second supply voltage that is greater than the first supply voltage during use.

Integrated circuit with separate supply voltage for memory that is different from logic circuit supply voltage

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Morgan Hill, CA, United States of America

Daniel C Murray