Growing community of inventors

Hampton, VA, United States of America

Daniel Bivolaru

Average Co-Inventor Count = 3.10

ph-index = 2

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 8

Daniel BivolaruGeorge Papadopoulos (5 patents)Daniel BivolaruJiaji Lin (4 patents)Daniel BivolaruPaul M Danehy (2 patents)Daniel BivolaruSpencer P Kuo (1 patent)Daniel BivolaruNicholas Tiliakos (1 patent)Daniel BivolaruJoseph W Lee (1 patent)Daniel BivolaruSkip Williams (1 patent)Daniel BivolaruCampbell Carter (1 patent)Daniel BivolaruAndrew D Cutler (1 patent)Daniel BivolaruDaniel Bivolaru (8 patents)George PapadopoulosGeorge Papadopoulos (9 patents)Jiaji LinJiaji Lin (5 patents)Paul M DanehyPaul M Danehy (10 patents)Spencer P KuoSpencer P Kuo (7 patents)Nicholas TiliakosNicholas Tiliakos (5 patents)Joseph W LeeJoseph W Lee (1 patent)Skip WilliamsSkip Williams (1 patent)Campbell CarterCampbell Carter (1 patent)Andrew D CutlerAndrew D Cutler (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Innoveering, LLC (3 from 6 patents)

2. General Electric Company (2 from 51,920 patents)

3. United States of America As Represented by the Administrator of Nasa (2 from 2,453 patents)

4. Other (1 from 832,880 patents)

5. United States of America As Represented by the Secretary of the Air Force (1 from 4,997 patents)

6. Washington University (1 from 1,585 patents)


8 patents:

1. 12287236 - Shock wave detection systems and methods

2. 11841266 - Evanescent field coupled shock wave detection systems and methods

3. 11519779 - Evanescent field coupled shock wave detection systems and methods

4. 11469082 - Plasma-based electro-optical sensing and methods

5. 11153960 - Plasma-based electro-optical sensing and methods

6. 9681529 - Microwave adapting plasma torch module

7. 8976351 - Spatially-and temporally-resolved multi-parameter interferometric rayleigh scattering system and method

8. 7414708 - Interferometric Rayleigh scattering measurement system

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