Arryx, Inc

Premium Genetics (uk) Limited

Dan Mueth

Evan Tanner

Lewis S Gruber

Joseph Plewa

Gary R Stacey

Jessica Shireman

Kenneth Forbes Bradley

Christopher R Knutson

Robert Lancelot

Osman Akcakir

Haojun Fu

Tania Chakrabarty

Crystal J Duke

Neil Harris Rosenbaum

Methods and apparatus for analyzing surface properties of particles are provided. A method for analyzing the surface properties of the particle includes a associating a first particle with a first capture zone having a specific binding affinity for a first chemical species, applying an optical force to the first particle, sensing a response of the first particle to the optical force, and using the sensed response to determine the presence, absence or quantity of the first chemical species on the first particle surface. This process may be repeated in parallel to test multiple particles. In addition to directly testing the surface properties of the particles, the method can be used in direct, indirect and competitive assays to determine the presence, absence or quantity of free or immobilized analytes. A fluidic cartridge with capture zones having avidities that are tuned for the use of optical forces is provided. A software routine for performing the method is also provided.

Surface mapping by optical manipulation of particles in relation to a functionalized surface

A method and apparatus for manipulating particles (micro, nano, and pico) having one or more characteristics with an optical trap formed by modulating a laser beam with a Diffractive Optical Element (DOE). At least one characteristic of the material is selected; and a laser beam having a selected wavelength corresponding to the at least one selected characteristic of the material is generated. Values of the DOE are calculated corresponding to the at least one selected characteristic of the material. The beam and the DOE are modulated to produce a holographic optical trap having properties corresponding to the at least one selected characteristic. The trap is focused to a beam focus or selected spot size; and the beam focus is located near a particle location for trapping the particle therein.

System and method for manipulating and processing materials using holographic optical trapping

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Chicago, IL, United States of America

Dan Mueth