Kulicke and Soffa Industries, Inc.

Dan Mironescu

Ziv Atzmon

Gil Perlberg

Edward T Laurent

Edward Lambert Malantonio

Lich Thanh Tran

Ilan Hanoon

A probe configured for use in the testing of integrated circuits includes a first end portion terminating in a foot (), the foot defining a substantially flat surface configured to be connected to a substrate (), a second end portion terminating in a tip (), the tip being configured to contact an integrated circuit during testing of the integrated circuit, and a curved body portion () extending between the first end portion and the second end portion.

Probes for a wafer test apparatus

A bonding tool for bonding a wire to a substrate. The bonding tool has a cylindrical body portion formed from a first material and a conical tip portion separately formed from a second material. The conical tip portion is coupled to one end of the body portion.

Multi-part capillary

Growing community of inventors

Yoqneam Illit, Israel

Dan Mironescu