Optimal Plus Ltd.

Dan Glotter

Shaul Teplinsky

Reed Linde

Leonid Gurov

Alexander Chufarovsky

Hagay Gur

A method of testing a tester, comprising testing electronic units using a plurality of sites in order to obtain first bin assignment, instructing the tester to perform a tester quality test if conditions Cand Care met, the tester quality test comprising performing a second plurality of tests on an electronic unit using a first site, thereby obtaining second bin assignment for the electronic unit, the second bin assignment being representative of passing or failing of the electronic unit of the second plurality of tests with respect to at least one second test criteria, wherein Cis met if passing first bin assignment has been obtained for said electronic unit connected to the tester using the first site, and wherein Cis met if data representative of passing first bin assignment obtained for electronic units which have been tested on the first site, meets a quality criteria.

Methods and systems for testing a tester

Systems and methods for deciding whether or not to indicate misalignment. In some examples, an analysis of parametric data relating to tests sensitive to misalignment is performed in order to determine which data is incongruous and to identify corresponding probes or socket contacts as suspected misaligned. In some examples, additionally or alternatively, a spatial analysis quantifies the placement of a set of identified suspected misaligned probes, which were identified from pass/fail test data and/or parametric test data, with respect to a contiguous or non-contiguous area on one or more wafers.

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Tel Aviv, Israel

Dan Glotter