Intel Corporation

Dan Bockelman

Md Asifur Rahman

Systems, apparatuses, methods, and computer program products for performing silicon debugging and isolating faults in integrated circuits are disclosed. Some embodiments comprise a simulator to simulate operation of one or more portions of a circuit in order to identify elements of the circuit which are related to a fault, a circuit pruner to separate the related elements from other elements of the circuit and correlate the related elements to a physical layout of the elements, and a probe tool to locate one or more of the related elements which cause or contribute to the fault. Alternative embodiments may comprise computer programs for simulating operation of a circuit to determine related elements of a fault, correlating the related elements to a physical layout or arrangement of the elements in the circuit, and testing the related elements via the physical layout to determine which elements contribute to the fault.

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Tigard, OR, United States of America

Dan Bockelman