Marvell Israel (Misl) Ltd.

Dan Aharoni

Yaniv Kopelman

Ruven Torok

Eyal Herzog

Avichai Zalcberg

Aspects of the disclosure provide an integrated circuit (IC) chip. The IC chip includes a memory module that includes one or more memory blocks. Each memory block includes a memory array having a first memory portion and a redundant memory portion, a failed memory indicator that, in response to a memory test, is configured to provide an indication of a failed memory portion in the first memory portion, and a wrapper circuit that, in response to the indication of the failed memory portion, is configured to repair the memory array by using the redundant portion instead of the failed memory portion.

Method and system for memory test and repair

A hash function is applied to a set of data to generate a hash. A first subset of the hash is used to lookup an entry in a lookup table for a forwarding database. A second subset of the hash is used to identify, within the entry, data comprising an offset. The offset is applied to a location identified in the forwarding database by the first subset of the hash to determine an entry in the forwarding database. Optionally, the lookup mechanism is used in conjunction with one or more other forwarding databases. A method of updating the forwarding database within the double hash lookup framework is also described.

Growing community of inventors

Beit Horon, Israel

Dan Aharoni