Seagate Technology Incorporated

Dale E Egbert

Lin Zhou

Huiwen Liu

Jonathan Arland Nelson

Jianxin Zhu

Peter John Gunderson

Declan Macken

Daniel Paul Burbank

Jeremy Adam Thurn

Youping Mei

Ling Ma

John L Ibele

Jun Mou

Zine-Eddine Boutaghou

Jing Gui

Dallas W Meyer

Bruno Jean Marchon

Peter Raymond Segar

Lance Eugene Stover

Ramesh Sundaram

Joel William Hoehn

Zine Eddine Boutaghou

Huan H Tang

John L Brand

Mary Cynthia Hipwell

Andreas Argyros Polycarpou

David Gerard Wobbe

Subrahmanyan Nagarajan

Jeffery K Berkowitz

Maher Abdullah Alodan

Kah Choong Loo

Cing Siong Ling

Apparatus and associated method that contemplates performing a first atomic force microscope (AFM) scan of a first region of a sample centered at a first position at a first angle to produce a first scan image, the first AFM scan including a first component scan at a first speed and a second component scan at a second speed; performing a second AFM scan of the first region of the sample at a second angle to produce a second scan image, the second AFM scan including performing a third component scan at the first speed and a fourth component scan at the second speed; and correcting a first error in the first scan image based on the second scan image to produce a corrected image output.

Atomic force microscopy of scanning and image processing

A topographic profile of a structure is generated using atomic force microscopy. The structure is scanned such that an area of interest of the structure is scanned at a higher resolution than portions of the structure outside of the area of interest. An profile of the structure is then generated based on the scan. To correct skew and tilt of the profile, a first feature of the profile is aligned with a first axis of a coordinate system. The profile is then manipulated to align a second feature of the profile with a second axis of the coordinate system.

A method and associated apparatus for topographically characterizing a workpiece. The workpiece is scanned with a scanning probe along a first directional grid, thereby scanning a reference surface and an area of interest subportion of the reference surface, at a variable pixel density including a first pixel density outside the area of interest and a second pixel density inside the area of interest to derive a first digital file characterizing topography of the workpiece. The workpiece is further scanned along the reference surface and the area of interest with the scanning probe along a second directional grid that is substantially orthogonal to the first directional grid and at a constant pixel density to derive a second digital file characterizing topography of the workpiece. A processor executes computer-readable instructions stored in memory that generate a topographical profile of the workpiece in relation to the first and second digital files.

Variable pixel density imaging

An apparatus and associated method for topographically characterizing a workpiece. A scanning probe obtains topographical data from the workpiece. A processor controls the scanning probe to scan a reference surface of the workpiece to derive a first digital file and to scan a surface of interest that includes at least a portion of the reference surface to derive a second digital file. Correlation pattern recognition logic integrates the first and second digital files together to align the reference surface with the surface of interest.

Scanning probe microscopy employing correlation pattern recognition

An atomic force microscopy (AFM) method includes a scanning probe that scans a surface of a structure to produce a first structure image. The structure is then rotated by 90&#xb0; with respect to the scanning probe. The scanning probe scans the surface of the structure again to produce a second structure image. The first and second structure images are combined to produce best fit image of the surface area of the structure. The same method is used to produce the best fit image of a flat standard. The best fit image of the flat standard is subtracted from the best fit image of the structure to obtain a true topographical image in which Z direction run out error is substantially reduced or eliminated.

Atomic force microscopy true shape measurement method

A method and apparatus are provided for adjusting recession of an element, such as a pole tip, in a transducer structure formed in a plurality of thin film layers on an edge of a slider. A pre-stressed structure is formed as part of the plurality of thin film layers on the edge of the slider. The pre-stressed structure has a level of material stress. The recession is measured relative to a bearing surface of the slider, and then the level of material stress is adjusted as a function of the measured to effect a corresponding change in the recession.

Method of adjusting recession of an element of a slider

Atomic force microscopy scanning and image processing

A sensor comprises a transducer portion including a semi-permanently deformable portion. A deformation of the semi-permanently deformable portion in response to an activation energy deforms the transducer portion. The deformation is retained after the activation energy is removed. In another embodiment of the invention, a transducer comprises a body having an active element, a magnetostrictive element and a magnet having a magnetic field. The magnetic field causes a deformation of the magnetostrictive portion thereby adjusting the position of the active element.

Sensor with semi-permanently deformable element for active element adjustment

Slider having adjusted transducer recession and method of adjusting recession

An air bearing slider includes a slider body, a head stack portion attached to a rear portion of the slider body, and a transducer contained within the head stack having a pole tip for communicating with a disc. A distance separates a plane containing the bottom surface of the pole tip and a plane containing the bottom surface of the slider body. The head stack portion includes a material that is semi-permanently deformable, and a deformation of the material changes the distance. A method for adjusting a pole tip position in an air bearing slider includes providing an air bearing slider having a material within a head stack portion. A distance separates a plane containing the bottom surface of the pole tip and a plane containing the bottom surface of the slider body. The method includes semi-permanently deforming the material to change the distance.

Headstack with semi-permanently deformable element for pole-tip recession adjustment

An information handling system, such as a disk drive, including a base, a disk stack rotatably attached to the base, and an actuator assembly movably attached to the base. The actuator assembly also includes a load spring and a slider attached to said load spring. The slider and load spring are attached to form a gimballing connection between the slider and the load spring. The slider includes an air-bearing surface which has a contact area. The slider also includes a transducer. The transducer is typically located near said contact area. The contact area includes a roughened surface portion and a smooth surface portion. The smooth surface portion is adjacent the transducer. The roughened surface portion is rougher than the smooth surface portion. The roughened surface portion is also rougher than the other surfaces associated with the air-bearing surface of the slider. The roughened surface portion of the contact area is formed by one of several techniques. One of the techniques uses a wet etch to remove at least one of the phases of a multi-phase material. Another technique defines the area to be roughened using photolithography. After exposing the photoresist using either a mask or a laser, a portion of photoresist is removed and the areas unprotected by photoresist are dry etched to form the roughened contact area.

Patterned and directional selective roughening of a slider air-bearing surface

A disc storage system includes a rotating disc and a transducer. The transducer is carried on a slider which is supported by an armature. The armature is used to move the slider radially across the disc surface whereby information may be read from or written to the disc surface of the transducer. The slider includes an air bearing surface which faces the disc surface. As the disc rotates, the air bearing surface causes the slider to &ldquo;fly&rdquo; over the disc surface. Pads are provided on the air bearing surface to improve operational characteristics of the system.

Slider having air bearing surface which includes pads for disk storage system

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Deephaven, MN, United States of America

Dale E Egbert