Nippon Chemi-con Corporation

Daizou Senzai

Takahiro Yoshida

Hirotsugu Ashino

Fusayoshi Endoh

Toshihiko Furukawa

A method includes processes of (a processing part) calculating an estimated heat generation temperature by using drive conditions (, a storage part) at least including drive timing information () and drive current value information (), and temperature change characteristic information () of a capacitor, calculating state change information () of the capacitor after elapse of a reference time by using the estimated heat generation temperature, and calculating a lifespan estimation value (lifespan estimation result) of the capacitor by using the state change information. This enables capacitor lifespan estimation corresponding to fluctuations of a drive current value flowing through the capacitor, the applicability of the capacitor is confirmed, and the safety of equipment using the capacitor is improved.

Capacitor lifespan estimation method, lifespan estimation program thereof, information processing device, and capacitor

A capacitor includes a capacitor element having electrode foils on the anode side and the cathode side laminated via separators, connecting parts of terminal components being disposed inside a laminated portion of the electrode foils and the separators, the connecting parts being connected to the electrode foils on the anode side and the cathode side; and a case that includes a storage part storing the capacitor element and having an opening portion sealed by a sealing body, that has a crimped part crimped from the outside of the storage part toward a side surface of the capacitor element, and that holds the capacitor element with the crimped part. The case is crimped to form the crimped part while avoiding a position at which the electrode foils of the capacitor element in the storage part overlap with tip portions of the connecting parts of the terminal components.

Growing community of inventors

Tokyo, Japan

Daizou Senzai