Renesas Technology Corp.

Hitachi Ulsi Systems Co., Ltd.

Daisuke Shimadu

Masao Shinozaki

Hiroshi Toyoshima

Masahiko Nishiyama

A semiconductor integrated circuit device provided with a memory circuit having a word line selection circuit with reduced leakage current is provided. The memory circuit includes: second word lines with which memory cells are connected; multiple bit lines that are extended in a direction orthogonal thereto and electrically connected with memory cells corresponding to selected second word lines of a plurality of the second word lines; and word drivers, constructed of CMOS inverter circuits, that select or deselect the second word lines. The sources of p-channel MOSFETs that constitute a plurality of word drivers including second word lines corresponding to selected bit lines are supplied with a voltage at a level at which second word lines are selected. The sources of the p-channel MOSFETs of the other word drivers are supplied with a voltage corresponding to a level at which second word lines are deselected.

Semiconductor integrated circuit device

The invention provides a semiconductor integrated circuit device having a signal transmission path realizing high speed and low power consumption with a simple configuration. The device has a signal transmission path for transmitting a signal by discharging one of first signal lines corresponding to complementary input signals in a plurality of first signal lines precharged by a precharge circuit, and a self reset circuit for detecting the discharge level of the pair of signal lines corresponding to the complementary signals out of the plurality of first signal lines and operating the precharge circuit at a timing later than the period of discharging.

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Kodaira, Japan

Daisuke Shimadu