Hitachi, Ltd.

Daisuke Katsuta

Yuji Takagi

Mineo Nomoto

Atsushi Yoshida

Seiji Hata

Toshio Asano

Kazuo Majima

Tetsuo Taguchi

Isao Tanaka

Jun Mochizuki

Teruo Matsuo

Kinuyo Hagimae

Masao Taniguchi

Masahiro Hotta

An image input can be executed without any influence of physical conditions of an inspection object and environment such as installation area by utilizing a cordless type image pickup apparatus in the excellent portability combining a lighting apparatus to a digital camera. On the occasion of picking up an image of such inspection object, marks of the shape such as the rectangular shape, circular shape and linear line shape and marks of the shape combining the linear lines (plus sign (+), capital letter L or cross (+)) of known size are allocated within the same image and these marks are extracted simultaneously. Thereby, compensation process for the magnifying factor, position and tilt is conducted using the marks allocated in the image with the equal interval. Input data is continuously applied depending on the inspection object to generate a total inspection map by combining such input data. A computer executes a flaw detection process and stores the processing result in the form of a file together with the inspection images. Thereby, an inspection management system for search using information and inspection result of the inspection object as the characteristics element can be established.

Method for non-destructive inspection, apparatus thereof and digital camera system

An apparatus for identifying positions of pixel defects on a display screen, such as a cathode-ray tube or a liquid crystal display, operates to pick up an image signal of a display screen representing a predetermined image with an imaging camera, shift the image signal of the imaging camera by one pixel in one and another directions with respect to the display screen, and obtain a difference of a signal level between a defective portion and a normal portion on the screen, based on the signals obtained when the image signal of the imaging camera is shifted in one and another directions. The apparatus also serves to calculate a relative inclination between the imaging camera and the display screen for obtaining a difference of a signal level between a defective portion and a normal portion of each pixel. The results make it possible to clearly identify the difference of the signal level between the defective portion and the normal portion.

Method and apparatus for checking defect on display screen

Light projectors for slit lights are so arranged that at least two slit lines developed by projecting the slit lights on a chip component or the like obliquely thereto intersect each other, and the slit lines are imaged from above the component or the like by TV cameras so as to extend horizontally in the corresponding images. The shapes of the slit lines in the images are analyzed by an image processor, to detect the state change of the chip component or the like, such as the misplacement thereof. Further, if necessary, in order to enhance the contrast of the pattern of the slit line, the slit light is projected by a stroboscopic lamp within the exposure time of the TV camera, for a short time interval which is not longer than the exposure time.

Apparatus and method for inspecting defect of mounted component with

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Yokohama, Japan

Daisuke Katsuta