Daifuku Co., Ltd.

Renesas Electronics Corporation

Mitsubishi Electric Corporation

Daisuke Katagiri

Wataru Kiyokawa

Hiroyuki Yamada

Terunori Kubo

Nobukazu Kosone

Yoshifumi Yamaguchi

Hirotsugu Nakamura

Shinichiro Ido

A control device performs selection processing for determining a selected conveyor that is to be the destination of a target article. The selection processing is processing for, if a second conveyor in which an article of the same type as the target article is the most-upstream article and there is no adjacent same-type article group, and a second conveyor in which an articles of the same type as the target article is the most-upstream article and there is an even number of articles in the adjacent same-type article group, are pairing target conveyors and there is a pairing target conveyor, determining the pairing target conveyor as the selected conveyor, and if there is no pairing target conveyor, determining a second conveyor selected according to a predetermined basic selection rule as the selected conveyor.

Article storage facility

A supply device () includes a first conveyor (A) arranged to be adjacent on a first side (Y) in a second direction with respect to the first transfer device (A), a second conveyor (B) arranged to be adjacent on the first side (Y) in the second direction with respect to a second transfer device (B), and a third conveyor (C) including a first connection portion (A) connected to an end on the first side (Y) in the second direction of the first conveyor (A) and a second connection portion (B) connected to an end on the first side (Y) in the second direction of the second conveyor (B). A plurality of articles (W) can be arranged side-by-side in a second direction (Y) on the first conveyor (A), and a plurality of articles (W) can be arranged side by side in the second direction (Y) on the second conveyor (B).

A rotary machine includes a rotor having a cylindrical shape and having a main oil feed hole through which lubricating oil passes and that is provided in an axial direction and a slide bearing provided outward in a radial direction with a gap between the rotor and the slide bearing and configured to hold the rotor so that the rotor rotates around an axis. The rotor is provided with a branch oil feed hole through which the gap and the main oil feed hole communicate with each other and through which the lubricating oil passes. A foreign matter separating portion configured to separate foreign matter from the lubricating oil is provided further backward in a direction of rotation of the rotor than the branch oil feed hole.

Bearing structure, compressor, and refrigeration cycle apparatus with foreign matter separator

A transfer operation control unit changes, according to an operating state index indicating a level of an operating state of a plurality of transport vehicles () present on a travel path, a setting of a transfer operation such that a required transfer time (Tr) from start to completion of the transfer operation is increased as the level of the operating state is reduced, while maintaining at least one setting of a traveling speed of the transport vehicles ().

Article transport facility

A semiconductor device includes an external terminal, an input buffer having an input terminal connected to the external terminal, a voltage generating circuit configured to generate a test voltage supplied to the input terminal, and a control circuit configured to determine whether the input buffer is deteriorated based on the test voltage supplied to the input terminal and an output level of the input buffer responding to the test voltage.

Semiconductor device and self-diagnostic method of semiconductor device

Methods of controlling semiconductor device and semiconductor device are provided in which a semiconductor device can define a normally operational ambient temperature at a low level. The Microcontroller includes a logical block, a temperature sensor for measuring junction temperature, a power consumption circuit for consuming predetermined power, and a Controller for controlling the consumption of power by the power consumption circuit such that the temperature measured at the temperature sensor is not less than a predetermined operational lower limit temperature of the logical block

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Tokyo, Japan

Daisuke Katagiri