Kabushiki Kaisha Toshiba

Kioxia Corporation

Toshiba Infrastructure Systems & Solutions Corporation

Kaisha Toshiba

Daiki Kiribuchi

Takeichiro Nishikawa

Satoru Yokota

Soh Koike

Tadayoshi Uechi

Takashi Endo

Takashi Usui

Hideyuki Aisu

Takufumi Yoshida

Shizu Sakakibara

Toshiaki Ohgushi

Ryota Narasaki

Takashi Tsurugai

Hidetaka Eguchi

Kunihiro Shimada

Masashi Tomita

Takehiko Tsuboi

An information processing apparatus has an output data acquisition unit configured to acquire an output value obtained by performing an experiment or simulation based on an input parameter of a predetermined number of dimensions, an evaluation value calculation unit configured to calculate and output an evaluation value of the output value, an outlier processing unit configured to output a converted evaluation value including a specified value obtained by converting the evaluation value that does not satisfy a predetermined criterion, a next input parameter determination unit configured to determine a next input parameter based on the input parameter and the converted evaluation value corresponding to the input parameter, and an iteration determination unit configured to repeat processing of the output data acquisition unit, the evaluation value calculation unit, the outlier processing unit, and the next input parameter determination unit until a predetermined condition is satisfied.

Information processing apparatus and information processing method

According to one embodiment, an information processing device includes a processor configured to determine items to be put on a plurality of first shelves which are capable of moving to a picking station, on a basis of distances between the plurality of first shelves and the picking station and order information of the items.

Information processing device, information processing method, non-transitory computer readable medium, and information processing system

An information processing apparatus according to an embodiment of the present invention includes an estimator and a recommender. The estimator is configured to, based on a data set including a set value set for a parameter and an evaluation value or an evaluation value variation where the set value is set for the parameter, estimate a relationship between the set value and the evaluation value variation. The evaluation value variation indicates a variation of respective evaluation values where a plurality of values included within a neighborhood range that is based on the set value are set for the parameter. The recommender is configured to, based on the estimated relationship, determine a recommended set value.

Information processing apparatus, information processing method, and non-transitory computer readable medium

One embodiment of the invention provides an apparatus preventing degradation of accuracy of a search result while reducing a total required period of a series of processing in a case where input parameters for a series of processing including a plurality of processing with different required periods are searched for. The apparatus includes a calculator and a generator. The calculator calculates evaluation values for output parameters of a series of processing including first processing and second processing. The first processing uses a first input parameter. The second processing use a second input parameter. The generator regenerates first and second input parameters corresponding to one time of a series of processing based on first and second input parameters corresponding to selected output parameters. The number of input parameters for shorter one of the first and the second processing is larger than the number of input parameters for the other.

Information processing apparatus, information processing method, non-transitory storage medium, and information processing system

A manufacturing control apparatus has an acquiring part that acquires past manufacturing data in which a target value of an output value of the intermediate product, the output value of the intermediate product, and quality of a final product produced from the manufacturing apparatus are associated with one another, an output predicting part that predicts, based on the target value of the intermediate product and the output value of the intermediate product in the past manufacturing data, the output value of the intermediate product for each of possible target values of the intermediate product, and a quality predicting part that predicts, based on the output value of the intermediate product and the quality of the final product in the past manufacturing data, the quality of the final product from a predicted value of the output value of the intermediate product for each of the predicted possible target values.

Test circuit and test method

An optimization device includes an output data acquisitor that acquires output data having a second number of dimensions obtained by performing an experiment or a simulation, an evaluation value calculator that calculates and outputs an evaluation value of the output data, a features extractor that extracts an output data features having a third number of dimensions different from the second number of dimensions, an input parameter converter that generates a conversion parameter related to the output data features predicted from the input parameters, a next input parameter determinator that determines a next input parameter to be acquired by the output data acquisitor, based on the conversion parameter and the corresponding evaluation value, and an iterative determinator that repeats processes of the output data acquisitor, the input/output data storage, the evaluation value calculator, the features extractor, the input parameter converter, and the next input parameter determinator.

Device and method for optimizing an input parameter in a processing of a semiconductor

An optimization apparatus includes an output data acquirer to acquire output data expressing a result of experiment or simulation based input parameters, input/output data storage to store the input parameters and the output data corresponding to the input parameters, as a pair, an evaluation value calculator to calculate evaluation values of the output data, an input parameter converter to generate conversion parameters of a dimension number changed from the dimension number of the input parameters, a next-input parameter decider to decide next input parameters based on pairs of the conversion parameters and the evaluation values corresponding to the conversion parameters, and a repetition determiner to repeat operations of the output data acquirer, the input/output data storage, the evaluation value calculator, the input parameter converter, and the next-input parameter decider, until satisfying a predetermined condition.

Optimization apparatus, simulation system and optimization method for semiconductor design

According to one embodiment, physical position information on errors on a recording medium is acquired, physical position relationship between the errors on the recording medium is calculated based on the position information, and a failure mode related to the errors is determined based on the position relationship.

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Katsushika Tokyo, Japan

Daiki Kiribuchi