University of Washington

Daibashish Gangopadhyay

David Allstot

Disclosed herein are example methods, systems, and devices for compressed sensing analog to digital conversion. In an example embodiment, a multiplication circuit is configured to multiply an input signal with a measurement signal to produce a multiplied signal, where the measurement signal includes data from a column of a measurement matrix. The measurement matrix may be generated by a linear feedback shift register (LFSR)-based measurement-matrix generator. An integration circuit may be coupled to the multiplication circuit and configured to integrate the multiplied signal for a predefined amount of time to produce an integrated signal. An analog to digital converter (ADC) circuit may be coupled to the integration circuit and configured to (i) sample the integrated signal and (ii) produce an output signal comprising at least one sample of the integrated signal. A column-wise multiplication of the input signal with the measurement signal enables an efficient compressed-sensing analog-to-digital conversion architecture.

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Mountain View, CA, United States of America

Daibashish Gangopadhyay