Intel Corporation

Daher Kaiss

Ziyad Hanna

John Moondanos

Carl Seger

Tal Erlich

Maayan Fishelson

Embodiments of methods and apparatus for optimization of verification of a chip design are disclosed. In various embodiments, a method for reducing a number of points to be verified during a verification process is disclosed, the method comprising selecting a first and a second verification point of a model of an integrated circuit design, determining whether the first and second verification points are isomorphic, and outputting the result of the determining to enable the first and second verification points being verified by verifying only a selected one of the first and second verification points in case the first and the second verification points are isomorphic. Additional variants and embodiments may also be disclosed and claimed.

Optimization of verification of chip design

The present invention provides a method and system for comparing a pair of circuit models without the need for performing a false negative check when cut-points are introduced. An exemplary method includes generating a BDD for each of a plurality of signals of each circuit model from an initial cut-point frontier towards an output of each circuit model until a BDD of one of the plurality of signals reaches a predetermined maximum size, selecting a new cut-point signal frontier, and generating a normalized function for each cut-point signal on the new cut-point frontier of each circuit model.

Growing community of inventors

Nahif Village, Israel

Daher Kaiss